Paper Abstract and Keywords |
Presentation |
2010-12-16 15:55
Measurement of scattering parameters of devices with waveguide ports and coaxial line ports using unknown "thru" calibration Minoru Sanagi, Kazuhiro Fujimori, Shigeji Nogi (Okayama Univ.) MW2010-126 Link to ES Tech. Rep. Archives: MW2010-126 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Measurements of scattering parameters of devices with rectangular waveguide ports and coaxial line ports have been investigated.
Unknown "thru" calibration was employed for characterizing a
transition for converting the coaxial line test port to the waveguide.
Transmission phase of the unknown "thru" must be known to within +-90 degree in the calibration procedure. A transition from the coaxial line to the waveguide used as the unknown "thru" was designed with an electromagnetic field simulator, and simulated values of the transmission phase was adopted as the required known values. The scattering parameters of a waveguide section with a coaxial probe were measured with a fabricated unknown "thru." |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
microwave / scattering matrix / network analyzer / unknown thru calibration / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 110, no. 343, MW2010-126, pp. 23-28, Dec. 2010. |
Paper # |
MW2010-126 |
Date of Issue |
2010-12-09 (MW) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
MW2010-126 Link to ES Tech. Rep. Archives: MW2010-126 |
Conference Information |
Committee |
MW |
Conference Date |
2010-12-16 - 2010-12-17 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kanazawa Inst. of Tech. |
Topics (in Japanese) |
(See Japanese page) |
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Paper Information |
Registration To |
MW |
Conference Code |
2010-12-MW |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Measurement of scattering parameters of devices with waveguide ports and coaxial line ports using unknown "thru" calibration |
Sub Title (in English) |
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microwave |
Keyword(2) |
scattering matrix |
Keyword(3) |
network analyzer |
Keyword(4) |
unknown thru calibration |
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1st Author's Name |
Minoru Sanagi |
1st Author's Affiliation |
Okayama University (Okayama Univ.) |
2nd Author's Name |
Kazuhiro Fujimori |
2nd Author's Affiliation |
Okayama University (Okayama Univ.) |
3rd Author's Name |
Shigeji Nogi |
3rd Author's Affiliation |
Okayama University (Okayama Univ.) |
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Speaker |
Author-1 |
Date Time |
2010-12-16 15:55:00 |
Presentation Time |
25 minutes |
Registration for |
MW |
Paper # |
MW2010-126 |
Volume (vol) |
vol.110 |
Number (no) |
no.343 |
Page |
pp.23-28 |
#Pages |
6 |
Date of Issue |
2010-12-09 (MW) |