Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2010-12-17 13:00
Integrated Model for Software Performability Measurement Considering Random Performance Degradation and Field-oriented Restoration
Koichi Tokuno, Shigeru Yamada (Tottori Univ.) R2010-37
Abstract (in Japanese) (See Japanese page) 
(in English) This paper constructs the integrated software performability model reflecting the actual field environment. The time-dependent behavior of the system alternating between up and down states is described by the Markov process. Then we incorporate the undesirable operational state and the field-oriented restoration scenario into the model, i.e., we consider the following two types of operational state: one is operating with the desirable performance level according to specification and the other is with degraded performance level, and the following two types of restoration: one is the restoration with debugging and the other is without debugging. Assuming that the software system can process the multiple tasks simultaneously, we describe the arrival process of the tasks follows a nonhomogeneous Poisson process and treat the processing time limit imposed on each task as a random variable. We analyze the distribution of the number of tasks whose processes can be completed within the processing time limit with the infinite server queueing model. From the model, we derive several software performability measures considering the real-time property. Finally, we illustrate several numerical examples of the measures to investigate the impacts of the difference of the operational performance levels and the field-oriented restoration on the system performability evaluation.
Keyword (in Japanese) (See Japanese page) 
(in English) Performability / Real-time property / Performance degradation / Field-oriented restoration scenario / Markov process / Software reliability growth / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 345, R2010-37, pp. 1-6, Dec. 2010.
Paper # R2010-37 
Date of Issue 2010-12-10 (R) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF R2010-37

Conference Information
Committee R  
Conference Date 2010-12-17 - 2010-12-17 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To R 
Conference Code 2010-12-R 
Language English (Japanese title is available) 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Integrated Model for Software Performability Measurement Considering Random Performance Degradation and Field-oriented Restoration 
Sub Title (in English)  
Keyword(1) Performability  
Keyword(2) Real-time property  
Keyword(3) Performance degradation  
Keyword(4) Field-oriented restoration scenario  
Keyword(5) Markov process  
Keyword(6) Software reliability growth  
Keyword(7)  
Keyword(8)  
1st Author's Name Koichi Tokuno  
1st Author's Affiliation Tottori University (Tottori Univ.)
2nd Author's Name Shigeru Yamada  
2nd Author's Affiliation Tottori University (Tottori Univ.)
3rd Author's Name  
3rd Author's Affiliation ()
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2010-12-17 13:00:00 
Presentation Time 25 minutes 
Registration for R 
Paper # R2010-37 
Volume (vol) vol.110 
Number (no) no.345 
Page pp.1-6 
#Pages
Date of Issue 2010-12-10 (R) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan