Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2010-12-17 14:45
Estimation the number of residual faults in software testing -- Parametric bootstrapping --
Toshio Kaneishi, Tadashi Dohi (Hiroshima Univ.) R2010-41
Abstract (in Japanese) (See Japanese page) 
(in English) The bootstraping duplicates the data itself by resampling the underlying population data and enables to investigate the statistical properties. It is useful to estimate standard errors and confidence intervals for complex estimators of complex parameters of the distribution from a small number of data. In software reliability engineering, it is common to estimate software reliability measures from the fault data (fault-detection time data) and focus on the point estimation. However, it is difficult in general to carry out the interval estimation or to obtain the probability distributions of the related estimators. In this paper, we assume that the software fault-detection process in testing is described by a non-homogeneous Poisson process. Based on the maximum likelihood estimation of parametric models such as an exponential NHPP model, we assess the probability distributions of software reliability measures in the sense of estimators, via parametric bootstrapping method.
Keyword (in Japanese) (See Japanese page) 
(in English) Software reliability model / NHPP / parametric bootstrapping / maximum likelihood method / number of residual faults / / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 345, R2010-41, pp. 23-28, Dec. 2010.
Paper # R2010-41 
Date of Issue 2010-12-10 (R) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF R2010-41

Conference Information
Committee R  
Conference Date 2010-12-17 - 2010-12-17 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To R 
Conference Code 2010-12-R 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Estimation the number of residual faults in software testing 
Sub Title (in English) Parametric bootstrapping 
Keyword(1) Software reliability model  
Keyword(2) NHPP  
Keyword(3) parametric bootstrapping  
Keyword(4) maximum likelihood method  
Keyword(5) number of residual faults  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Toshio Kaneishi  
1st Author's Affiliation Hiroshima University (Hiroshima Univ.)
2nd Author's Name Tadashi Dohi  
2nd Author's Affiliation Hiroshima University (Hiroshima Univ.)
3rd Author's Name  
3rd Author's Affiliation ()
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-2 
Date Time 2010-12-17 14:45:00 
Presentation Time 25 minutes 
Registration for R 
Paper # R2010-41 
Volume (vol) vol.110 
Number (no) no.345 
Page pp.23-28 
#Pages
Date of Issue 2010-12-10 (R) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan