| Paper Abstract and Keywords |
| Presentation |
2011-01-28 14:25
Current-voltage characteristics of top-emission printed EL devices using solution-processed ZnO nanocrystals Kazuki Itatani, Hayato Kawasaki, Toshihiko Toyama, Hiroaki Okamoto (Osaka Univ.) EID2010-30 |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
Current–voltage (J–V) measurements were performed on the top-emission EL devices with a printed emission layer involving solution-processed ZnO nanocrystals. The temperature dependence of J–V characteristics suggested the deposition method and the deposition conditions of top anodes play a crucial role in determining UV emission intensity. |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
nanocrystal / EL / solution-process / ZnO / exciton recombination / screen-printng / / |
| Reference Info. |
IEICE Tech. Rep., vol. 110, no. 404, EID2010-30, pp. 37-40, Jan. 2011. |
| Paper # |
EID2010-30 |
| Date of Issue |
2011-01-21 (EID) |
| ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
| Download PDF |
EID2010-30 |
| Conference Information |
| Committee |
EID ITE-IDY IEE-EDD IEIJ-SSL |
| Conference Date |
2011-01-28 - 2011-01-29 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
Kochi University of Technology |
| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
Display technology, etc |
| Paper Information |
| Registration To |
EID |
| Conference Code |
2011-01-EID-IDY-EDD-OMD |
| Language |
Japanese |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
Current-voltage characteristics of top-emission printed EL devices using solution-processed ZnO nanocrystals |
| Sub Title (in English) |
|
| Keyword(1) |
nanocrystal |
| Keyword(2) |
EL |
| Keyword(3) |
solution-process |
| Keyword(4) |
ZnO |
| Keyword(5) |
exciton recombination |
| Keyword(6) |
screen-printng |
| Keyword(7) |
|
| Keyword(8) |
|
| 1st Author's Name |
Kazuki Itatani |
| 1st Author's Affiliation |
Osaka University (Osaka Univ.) |
| 2nd Author's Name |
Hayato Kawasaki |
| 2nd Author's Affiliation |
Osaka University (Osaka Univ.) |
| 3rd Author's Name |
Toshihiko Toyama |
| 3rd Author's Affiliation |
Osaka University (Osaka Univ.) |
| 4th Author's Name |
Hiroaki Okamoto |
| 4th Author's Affiliation |
Osaka University (Osaka Univ.) |
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| Speaker |
Author-1 |
| Date Time |
2011-01-28 14:25:00 |
| Presentation Time |
10 minutes |
| Registration for |
EID |
| Paper # |
EID2010-30 |
| Volume (vol) |
vol.110 |
| Number (no) |
no.404 |
| Page |
pp.37-40 |
| #Pages |
4 |
| Date of Issue |
2011-01-21 (EID) |