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Paper Abstract and Keywords
Presentation 2011-02-24 12:00
Characterization of Single-Electron Stochastic Resonance in A Quantum Dot and Its Parallel Network
Seiya Kasai (Hokkaido Univ./JST), Yuta Shiratori, Kensuke Miura, Yuki Nakano (Hokkaido Univ.) ED2010-206 SDM2010-241
Abstract (in Japanese) (See Japanese page) 
(in English) We investigate the effect of physical variation on single-electron stochastic resonance (SE-SR) in the quantum-dot parallel summing network. Analysis is carried out using a commercial single electron circuit simulator. The SR response in each dot is changed when the dot capacitance is changed, corresponding with the dot size variation. However, the total response of the network system integrating varied dots is found to converge to that of the system consisting uniform dots. This result is quite different from the behavior of the varied threshold-voltage FET network, where the response obeys the envelope of response curve from each device.
Keyword (in Japanese) (See Japanese page) 
(in English) Stochastic Resonance / Single Electron / Quantum Dot / Thermal Fluctuation / Variation / / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 423, ED2010-206, pp. 79-82, Feb. 2011.
Paper # ED2010-206 
Date of Issue 2011-02-16 (ED, SDM) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ED2010-206 SDM2010-241

Conference Information
Committee SDM ED  
Conference Date 2011-02-23 - 2011-02-24 
Place (in Japanese) (See Japanese page) 
Place (in English) Hokkaido Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Functional nanodevices and related technologies 
Paper Information
Registration To ED 
Conference Code 2011-02-SDM-ED 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Characterization of Single-Electron Stochastic Resonance in A Quantum Dot and Its Parallel Network 
Sub Title (in English)  
Keyword(1) Stochastic Resonance  
Keyword(2) Single Electron  
Keyword(3) Quantum Dot  
Keyword(4) Thermal Fluctuation  
Keyword(5) Variation  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Seiya Kasai  
1st Author's Affiliation Hokkaido University/JST (Hokkaido Univ./JST)
2nd Author's Name Yuta Shiratori  
2nd Author's Affiliation Hokkaido University (Hokkaido Univ.)
3rd Author's Name Kensuke Miura  
3rd Author's Affiliation Hokkaido University (Hokkaido Univ.)
4th Author's Name Yuki Nakano  
4th Author's Affiliation Hokkaido University (Hokkaido Univ.)
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Speaker Author-1 
Date Time 2011-02-24 12:00:00 
Presentation Time 25 minutes 
Registration for ED 
Paper # ED2010-206, SDM2010-241 
Volume (vol) vol.110 
Number (no) no.423(ED), no.424(SDM) 
Page pp.79-82 
#Pages 4 
Date of Issue 2011-02-16 (ED, SDM) 

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