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Paper Abstract and Keywords
Presentation 2011-03-10 15:55
A Method to Analyze Failure Scenarios of Embedded Systems by Using Unexpected Phenomena
Toshiro Mise, Yasufumi Shinyashiki (Panasonic Electric Works), Keiichi Katamine, Masaaki Hashimoto (Kyusyu Inst. of Tech), Takako Nakatani (University of Tsukuba), Naoyasu Ubayashi (Kyushu University) KBSE2010-50
Abstract (in Japanese) (See Japanese page) 
(in English) This paper describes an analysis matrix and its method for extracting failure scenarios named ESIM (Embedded System Improving Method) in order to improve the safety of embedded system products such as the household electrical appliances. The method extracts product failures at the definition of the software requirement specifications. We can extract product failures by using existing failure analysis method when the failure occurs due to single serious fault of one device of the product. On the other hand, it is difficult to extract a failure which occurs by overlapping some minor faults although it is a serious problem. Especially, it is hard to extract failures that can only be found by analyzing the timing of the fault occurrence dynamically. This paper refines the analysis matrix which can dynamically analyze overlapping minor faults. It also describes a case study applied to an actual product development project, and discusses about effectiveness and practicality.
Keyword (in Japanese) (See Japanese page) 
(in English) Embedded Software / A Method for Extracting Failure / Failure Scenario / Requirements Analysis / / / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 468, KBSE2010-50, pp. 19-24, March 2011.
Paper # KBSE2010-50 
Date of Issue 2011-03-03 (KBSE) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee KBSE  
Conference Date 2011-03-10 - 2011-03-11 
Place (in Japanese) (See Japanese page) 
Place (in English) Beppu International Convention Center 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To KBSE 
Conference Code 2011-03-KBSE 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Method to Analyze Failure Scenarios of Embedded Systems by Using Unexpected Phenomena 
Sub Title (in English)  
Keyword(1) Embedded Software  
Keyword(2) A Method for Extracting Failure  
Keyword(3) Failure Scenario  
Keyword(4) Requirements Analysis  
Keyword(5)  
Keyword(6)  
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1st Author's Name Toshiro Mise  
1st Author's Affiliation Panasonic Electric Works Co.,Ltd (Panasonic Electric Works)
2nd Author's Name Yasufumi Shinyashiki  
2nd Author's Affiliation Panasonic Electric Works Co.,Ltd (Panasonic Electric Works)
3rd Author's Name Keiichi Katamine  
3rd Author's Affiliation Kyusyu Institute of Technology (Kyusyu Inst. of Tech)
4th Author's Name Masaaki Hashimoto  
4th Author's Affiliation Kyusyu Institute of Technology (Kyusyu Inst. of Tech)
5th Author's Name Takako Nakatani  
5th Author's Affiliation University of Tsukuba (University of Tsukuba)
6th Author's Name Naoyasu Ubayashi  
6th Author's Affiliation Kyushu University (Kyushu University)
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Speaker Author-1 
Date Time 2011-03-10 15:55:00 
Presentation Time 40 minutes 
Registration for KBSE 
Paper # KBSE2010-50 
Volume (vol) vol.110 
Number (no) no.468 
Page pp.19-24 
#Pages 6 
Date of Issue 2011-03-03 (KBSE) 

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