Paper Abstract and Keywords |
Presentation |
2011-03-10 15:55
A Method to Analyze Failure Scenarios of Embedded Systems by Using Unexpected Phenomena Toshiro Mise, Yasufumi Shinyashiki (Panasonic Electric Works), Keiichi Katamine, Masaaki Hashimoto (Kyusyu Inst. of Tech), Takako Nakatani (University of Tsukuba), Naoyasu Ubayashi (Kyushu University) KBSE2010-50 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
This paper describes an analysis matrix and its method for extracting failure scenarios named ESIM (Embedded System Improving Method) in order to improve the safety of embedded system products such as the household electrical appliances. The method extracts product failures at the definition of the software requirement specifications. We can extract product failures by using existing failure analysis method when the failure occurs due to single serious fault of one device of the product. On the other hand, it is difficult to extract a failure which occurs by overlapping some minor faults although it is a serious problem. Especially, it is hard to extract failures that can only be found by analyzing the timing of the fault occurrence dynamically. This paper refines the analysis matrix which can dynamically analyze overlapping minor faults. It also describes a case study applied to an actual product development project, and discusses about effectiveness and practicality. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Embedded Software / A Method for Extracting Failure / Failure Scenario / Requirements Analysis / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 110, no. 468, KBSE2010-50, pp. 19-24, March 2011. |
Paper # |
KBSE2010-50 |
Date of Issue |
2011-03-03 (KBSE) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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KBSE2010-50 |
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