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Paper Abstract and Keywords
Presentation 2011-03-11 16:35
A Study of Degradatuion Phenomenon of electrical Contacts by some Oscillating Mechanisms -- Modeling about Fluctuation of Contact Resistance --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masahiro Kawanobe, Masayoshi Kotabe, Hiroaki Kubota (TMC), Tohru Ikeguchi (Saitama Univ.), Yoshihiko Horio (Tokyo Denki Univ.), Koichiro Sawa (Nippon Insti. of Tech.) NLP2010-196
Abstract (in Japanese) (See Japanese page) 
(in English) The authors have developed some mechanisms which give real vibration to electrical contacts and studied the influences of a micro-oscillating on the contact resistance. Because it was necessary to deal with time-sequential data for analyzing the degradation phenomena of electrical contacts by the oscillating mechanisms, they tried non-linear data processing in addition to usually linear one. It was considered that the process extracted the characteristic of time-sequential fluctuation of the contact resistance from experimental results.
Keyword (in Japanese) (See Japanese page) 
(in English) degradation phenomenon / electrical contact / oscillating mechanism / contact resistance / time-sequential data / non-linear processing / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 465, NLP2010-196, pp. 187-192, March 2011.
Paper # NLP2010-196 
Date of Issue 2011-03-03 (NLP) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee NLP  
Conference Date 2011-03-10 - 2011-03-11 
Place (in Japanese) (See Japanese page) 
Place (in English) Tokyo University of Science 
Topics (in Japanese) (See Japanese page) 
Topics (in English) General 
Paper Information
Registration To NLP 
Conference Code 2011-03-NLP 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Study of Degradatuion Phenomenon of electrical Contacts by some Oscillating Mechanisms 
Sub Title (in English) Modeling about Fluctuation of Contact Resistance 
Keyword(1) degradation phenomenon  
Keyword(2) electrical contact  
Keyword(3) oscillating mechanism  
Keyword(4) contact resistance  
Keyword(5) time-sequential data  
Keyword(6) non-linear processing  
Keyword(7)  
Keyword(8)  
1st Author's Name Shin-ichi Wada  
1st Author's Affiliation TMC System Co. Ltd. (TMC)
2nd Author's Name Keiji Koshida  
2nd Author's Affiliation TMC System Co. Ltd. (TMC)
3rd Author's Name Saindaa Norovling  
3rd Author's Affiliation TMC System Co. Ltd. (TMC)
4th Author's Name Masahiro Kawanobe  
4th Author's Affiliation TMC System Co. Ltd. (TMC)
5th Author's Name Masayoshi Kotabe  
5th Author's Affiliation TMC System Co. Ltd. (TMC)
6th Author's Name Hiroaki Kubota  
6th Author's Affiliation TMC System Co. Ltd. (TMC)
7th Author's Name Tohru Ikeguchi  
7th Author's Affiliation Saitama University (Saitama Univ.)
8th Author's Name Yoshihiko Horio  
8th Author's Affiliation Tokyo Denki University (Tokyo Denki Univ.)
9th Author's Name Koichiro Sawa  
9th Author's Affiliation Nippon Institute of Technology (Nippon Insti. of Tech.)
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Speaker Author-1 
Date Time 2011-03-11 16:35:00 
Presentation Time 25 minutes 
Registration for NLP 
Paper # NLP2010-196 
Volume (vol) vol.110 
Number (no) no.465 
Page pp.187-192 
#Pages 6 
Date of Issue 2011-03-03 (NLP) 

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