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| Paper Abstract and Keywords | ||
| Presentation | 2011-09-27 10:45 A statistical evaluation of approximate methods for soft error tolerance analysis of combinational circuits Hidenori Ayabe, Masayoshi Yoshimura, Yusuke Matsunaga (Kyushu Univ.)  VLD2011-49 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | An approximate method which evaluates soft error tolerance with sampling has been proposed. There is an method to evaluate the accuracy of this approximate method．This method, however, needs standard deviation. To calculate standard deviation is difficult to apply to large scale circuits for consuming much time. This paper presents an estimation method of standard deviation for evaluation of soft error tolerance. By using this estimation method, it is possible to efficiently evaluate soft error tolerance. Experimental results show efficacy of proposal technique. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | soft error / combinational circuits / central limit theorem / standard deviation / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 111, no. 216, VLD2011-49, pp. 49-54, Sept. 2011. | |
| Paper # | VLD2011-49 | |
| Date of Issue | 2011-09-19 (VLD) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | VLD2011-49 |
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| Conference Information | |
| Committee | VLD |
| Conference Date | 2011-09-26 - 2011-09-27 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | University of Aizu |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Physical-level Design, etc. |
| Paper Information | |
| Registration To | VLD |
| Conference Code | 2011-09-VLD |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A statistical evaluation of approximate methods for soft error tolerance analysis of combinational circuits |
| Sub Title (in English) | |
| Keyword(1) | soft error |
| Keyword(2) | combinational circuits |
| Keyword(3) | central limit theorem |
| Keyword(4) | standard deviation |
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| 1st Author's Name | Hidenori Ayabe |
| 1st Author's Affiliation | Kyushu University (Kyushu Univ.) |
| 2nd Author's Name | Masayoshi Yoshimura |
| 2nd Author's Affiliation | Kyushu University (Kyushu Univ.) |
| 3rd Author's Name | Yusuke Matsunaga |
| 3rd Author's Affiliation | Kyushu University (Kyushu Univ.) |
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| Speaker | Author-1 |
| Date Time | 2011-09-27 10:45:00 |
| Presentation Time | 25 minutes |
| Registration for | VLD |
| Paper # | VLD2011-49 |
| Volume (vol) | vol.111 |
| Number (no) | no.216 |
| Page | pp.49-54 |
| #Pages | 6 |
| Date of Issue | 2011-09-19 (VLD) |
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