Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2011-10-28 10:35
Variations of radiated electromagnetic field due to low voltage ESD in spherical electrode.
Ken Kawamata (Hachinohe Inst. of Tech.), Shigeki Minegishi (TGU), Osamu Fujiwara (Nagoya Inst. of Tech.) EMCJ2011-81
Abstract (in Japanese) (See Japanese page) 
(in English) Amplitude properties of radiated electromagnetic field caused by low voltage ESD (electrostatic discharge) in spherical electrode was examined by experimental study. The micro-gap discharge as the low voltage ESD shows very fast transition-duration of about 32 ps or less, and potential gradient in electrode gap was very high of about 80 MV/m when the breakdown. Also, a relationship between the potential gradient in a gap and the radiated electromagnetic field was measured in a resonant experimental system using the electrode of dipole configuration. In this time, we present an improved experimental system to measure the radiated electromagnetic filed in more wideband region using spherical electrodes and a horn antenna. In this experiment, the amplitude of radiated electromagnetic field was expressed by an output voltage of the horn antenna. As a consequence, the amplitude of radiated field was proportion to the discharge voltage in from 300V to 620V. And so, the amplitude of radiated electromagnetic field was proportion to the diameter of the spherical electrode in the wideband experimental system.
Keyword (in Japanese) (See Japanese page) 
(in English) ESD / Radiated electromagnetic field / Micro gap discharge, Potential gradient / Wideband measurement / / / /  
Reference Info. IEICE Tech. Rep., vol. 111, no. 269, EMCJ2011-81, pp. 1-4, Oct. 2011.
Paper # EMCJ2011-81 
Date of Issue 2011-10-21 (EMCJ) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMCJ2011-81

Conference Information
Committee EMCJ IEE-EMC  
Conference Date 2011-10-28 - 2011-10-28 
Place (in Japanese) (See Japanese page) 
Place (in English) Hachinohe Grand Hotel 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Discharge, EMC, etc. 
Paper Information
Registration To EMCJ 
Conference Code 2011-10-EMCJ-EMC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Variations of radiated electromagnetic field due to low voltage ESD in spherical electrode. 
Sub Title (in English)  
Keyword(1) ESD  
Keyword(2) Radiated electromagnetic field  
Keyword(3) Micro gap discharge, Potential gradient  
Keyword(4) Wideband measurement  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Ken Kawamata  
1st Author's Affiliation Hachinohe Institute of Technology (Hachinohe Inst. of Tech.)
2nd Author's Name Shigeki Minegishi  
2nd Author's Affiliation Tohoku Gakuin University (TGU)
3rd Author's Name Osamu Fujiwara  
3rd Author's Affiliation Nagoya Institute of Technology (Nagoya Inst. of Tech.)
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2011-10-28 10:35:00 
Presentation Time 25 minutes 
Registration for EMCJ 
Paper # EMCJ2011-81 
Volume (vol) vol.111 
Number (no) no.269 
Page pp.1-4 
#Pages 4 
Date of Issue 2011-10-21 (EMCJ) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan