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Paper Abstract and Keywords
Presentation 2011-11-17 14:40
Dependence of Contact Resistance Distribution on Circuit Current after Occurrence of Break Arcs
Youhei Yamanashi, Katsuyoshi Miyaji, Junya Sekikawa, Takayoshi Kubono (Shizuoka Univ.) EMD2011-79 Link to ES Tech. Rep. Archives: EMD2011-79
Abstract (in Japanese) (See Japanese page) 
(in English) Break arcs are generated in a DC48V and 1-6A resistive circuit. Contact surface that is exposed by the break arc, the contact resistance is measured by changing the location. And, it intends to verify experimentally the dependence of contact resistance distribution on circuit current. As a result, the contact resistance distribution in the different contact surfaces with varying circuit current I0 and the arc duration becomes shorter and the size of the region of high contact resistance becomes smaller when circuit current is decreased.
Keyword (in Japanese) (See Japanese page) 
(in English) Break arc / Surface of contact / Anode / Circuit current / Contact Resistance / / /  
Reference Info. IEICE Tech. Rep., vol. 111, no. 299, EMD2011-79, pp. 67-72, Nov. 2011.
Paper # EMD2011-79 
Date of Issue 2011-11-10 (EMD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMD2011-79 Link to ES Tech. Rep. Archives: EMD2011-79

Conference Information
Committee EMD  
Conference Date 2011-11-17 - 2011-11-18 
Place (in Japanese) (See Japanese page) 
Place (in English) Akita Univ. Tegata Campus 
Topics (in Japanese) (See Japanese page) 
Topics (in English) International Session IS-EMD2011 
Paper Information
Registration To EMD 
Conference Code 2011-11-EMD 
Language English 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Dependence of Contact Resistance Distribution on Circuit Current after Occurrence of Break Arcs 
Sub Title (in English)  
Keyword(1) Break arc  
Keyword(2) Surface of contact  
Keyword(3) Anode  
Keyword(4) Circuit current  
Keyword(5) Contact Resistance  
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1st Author's Name Youhei Yamanashi  
1st Author's Affiliation Shizuoka University (Shizuoka Univ.)
2nd Author's Name Katsuyoshi Miyaji  
2nd Author's Affiliation Shizuoka University (Shizuoka Univ.)
3rd Author's Name Junya Sekikawa  
3rd Author's Affiliation Shizuoka University (Shizuoka Univ.)
4th Author's Name Takayoshi Kubono  
4th Author's Affiliation Shizuoka University (Shizuoka Univ.)
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Speaker Author-1 
Date Time 2011-11-17 14:40:00 
Presentation Time 20 minutes 
Registration for EMD 
Paper # EMD2011-79 
Volume (vol) vol.111 
Number (no) no.299 
Page pp.67-72 
#Pages
Date of Issue 2011-11-10 (EMD) 


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