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Paper Abstract and Keywords
Presentation 2011-11-17 17:30
A Robust Solution for Hesitate Phenomenon in Closing Process of Sealed Electromagnetic Relay
Jie Deng, Xuerong Ye, Yue Ma, Guofu Zhai (Harbin Inst. of Tech.) EMD2011-86
Abstract (in Japanese) (See Japanese page) 
(in English) To the Sealed Electromagnetic Relay (SEMR) of small batch and having difficulty in automatic production, so much manual work involved in assembly and adjustment process makes a remarkable hesitate phenomenon. A certain type of SEMR for example, the problem of coil voltage difference in actual production process has been studied in this article. The primary cause of this issue, 2-steps of armature motion in pickup process, has been found by analyzing the matching characteristics of electromagnetic torque and mechanical torque in SEMR. Through optimization of matching characteristics, the voltage difference problem is solved by robust design of reverse reed as a key part. The validity of this research has been proved by the comparison of dynamic characteristics simulation and the practical test of the relay products before and after the optimization.
Keyword (in Japanese) (See Japanese page) 
(in English) sealed electromagnetic relay / hesitate phenomenon / reverse reed optimization / robust design / / / /  
Reference Info. IEICE Tech. Rep., vol. 111, no. 299, EMD2011-86, pp. 103-108, Nov. 2011.
Paper # EMD2011-86 
Date of Issue 2011-11-10 (EMD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMD2011-86

Conference Information
Committee EMD  
Conference Date 2011-11-17 - 2011-11-18 
Place (in Japanese) (See Japanese page) 
Place (in English) Akita Univ. Tegata Campus 
Topics (in Japanese) (See Japanese page) 
Topics (in English) International Session IS-EMD2011 
Paper Information
Registration To EMD 
Conference Code 2011-11-EMD 
Language English 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Robust Solution for Hesitate Phenomenon in Closing Process of Sealed Electromagnetic Relay 
Sub Title (in English)  
Keyword(1) sealed electromagnetic relay  
Keyword(2) hesitate phenomenon  
Keyword(3) reverse reed optimization  
Keyword(4) robust design  
Keyword(5)  
Keyword(6)  
Keyword(7)  
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1st Author's Name Jie Deng  
1st Author's Affiliation Harbin Institute of Technology (Harbin Inst. of Tech.)
2nd Author's Name Xuerong Ye  
2nd Author's Affiliation Harbin Institute of Technology (Harbin Inst. of Tech.)
3rd Author's Name Yue Ma  
3rd Author's Affiliation Harbin Institute of Technology (Harbin Inst. of Tech.)
4th Author's Name Guofu Zhai  
4th Author's Affiliation Harbin Institute of Technology (Harbin Inst. of Tech.)
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Speaker Author-1 
Date Time 2011-11-17 17:30:00 
Presentation Time 20 minutes 
Registration for EMD 
Paper # EMD2011-86 
Volume (vol) vol.111 
Number (no) no.299 
Page pp.103-108 
#Pages 6 
Date of Issue 2011-11-10 (EMD) 

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