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Paper Abstract and Keywords
Presentation 2011-11-28 16:30
A study on parameter estimation for modeling of random-telegraph noise
Hiromitsu Awano, Hirofumi Shimizu, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato (Kyoto Univ.) VLD2011-66 DC2011-42
Abstract (in Japanese) (See Japanese page) 
(in English) Random Telegraph Noise (RTN) is a physical phenomenon that is considered to determine reliability and performance of circuits. Time constants of carrier capture and emission, and an associated change of threshold voltage are the important parameters commonly involved in various models, but their extraction from time-domain observations has been a difficult task. In this study, we propose a statistical method for estimating the time constants and the magnitude of threshold voltage shift. Our method is based on a graphical network representation and the parameters are estimated using Markov Chain Monte Carlo (MCMC) method. Experimental application of the proposed method on a synthetic time-domain RTN signal was very successful, while estimation examples on measured RTN signals suggest there is room for further improvement.
Keyword (in Japanese) (See Japanese page) 
(in English) Random Telegraph Noise / Bayesian Estimation / Markov chain Monte Carlo / / / / /  
Reference Info. IEICE Tech. Rep., vol. 111, no. 324, VLD2011-66, pp. 85-90, Nov. 2011.
Paper # VLD2011-66 
Date of Issue 2011-11-21 (VLD, DC) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF VLD2011-66 DC2011-42

Conference Information
Committee VLD DC IPSJ-SLDM CPSY RECONF ICD CPM  
Conference Date 2011-11-28 - 2011-11-30 
Place (in Japanese) (See Japanese page) 
Place (in English) NewWelCity Miyazaki 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design Gaia 2010 -New Field of VLSI Design- 
Paper Information
Registration To VLD 
Conference Code 2011-11-VLD-DC-SLDM-CPSY-RECONF-ICD-CPM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A study on parameter estimation for modeling of random-telegraph noise 
Sub Title (in English)  
Keyword(1) Random Telegraph Noise  
Keyword(2) Bayesian Estimation  
Keyword(3) Markov chain Monte Carlo  
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1st Author's Name Hiromitsu Awano  
1st Author's Affiliation Kyoto University (Kyoto Univ.)
2nd Author's Name Hirofumi Shimizu  
2nd Author's Affiliation Kyoto University (Kyoto Univ.)
3rd Author's Name Hiroshi Tsutsui  
3rd Author's Affiliation Kyoto University (Kyoto Univ.)
4th Author's Name Hiroyuki Ochi  
4th Author's Affiliation Kyoto University (Kyoto Univ.)
5th Author's Name Takashi Sato  
5th Author's Affiliation Kyoto University (Kyoto Univ.)
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Speaker Author-1 
Date Time 2011-11-28 16:30:00 
Presentation Time 25 minutes 
Registration for VLD 
Paper # VLD2011-66, DC2011-42 
Volume (vol) vol.111 
Number (no) no.324(VLD), no.325(DC) 
Page pp.85-90 
#Pages 6 
Date of Issue 2011-11-21 (VLD, DC) 

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