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Paper Abstract and Keywords
Presentation 2011-12-15 16:00
Preparation of High-Resolution Magnetic Force Microscope Tips with Co and Fe-B Magnetic Film Coating
Kazuki Soneta, Mitsuru Ohtake, Masaaki Futamoto (Chuo Univ.) MR2011-30
Abstract (in Japanese) (See Japanese page) 
(in English) Magnetic force microscope (MFM) tips are prepared by coating Si tips of 5 and 3 nm radiuses with Co and Fe-B alloy films. The effects of coating film thickness, Si tip radius, and surface undulation of coated material on the MFM resolution are investigated. The MFM resolution is influenced by both the tip radius and the MFM signal detection sensitivity. As the coating thickness increases, the sensitivity increases due to the increase in remanent magnetization of coated film material. However, with increasing the coating film thickness, the tip radius increases. A thicker coating film thickness degrades the MFM resolution due to an increase of tip radius, though the sensitivity is enhanced. A resolution of 9.0 nm is obtained with an MFM tip prepared by coating Si tip of 5 nm radius with 18-nm-thick Co film. The resolution improves to 7.8 nm by using a sharper Si tip of 3 nm radius coated with 20 nm thick Co film. The MFM resolution further improves by using an Fe82B18 alloy material which effectively decreases the MFM tip radius through realizing a smooth surface with reduced undulations around the top of MFM tip. A resolution of 7.3 nm is obtained with an MFM tip prepared by coating a Si tip of 3 nm radius with 20-nm-thick Fe82B18 film. The present research has shown that in order to prepare an MFM tip with high-resolution capability. It is very important to use a sharp base tip with smaller radius, coated of a higher remanent magnetization film with a smoother surface.
Keyword (in Japanese) (See Japanese page) 
(in English) magnetic force microscope / tip / resolution / Co / Fe-B alloy / perpendicular magnetic recording media / /  
Reference Info. IEICE Tech. Rep., vol. 111, Dec. 2011.
Paper #  
Date of Issue 2011-12-08 (MR) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF MR2011-30

Conference Information
Committee MRIS ITE-MMS  
Conference Date 2011-12-15 - 2011-12-16 
Place (in Japanese) (See Japanese page) 
Place (in English) Ehime Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Signal Processing, etc. 
Paper Information
Registration To MRIS 
Conference Code 2011-12-MR-MMS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Preparation of High-Resolution Magnetic Force Microscope Tips with Co and Fe-B Magnetic Film Coating 
Sub Title (in English)  
Keyword(1) magnetic force microscope  
Keyword(2) tip  
Keyword(3) resolution  
Keyword(4) Co  
Keyword(5) Fe-B alloy  
Keyword(6) perpendicular magnetic recording media  
Keyword(7)  
Keyword(8)  
1st Author's Name Kazuki Soneta  
1st Author's Affiliation Chuo University (Chuo Univ.)
2nd Author's Name Mitsuru Ohtake  
2nd Author's Affiliation Chuo University (Chuo Univ.)
3rd Author's Name Masaaki Futamoto  
3rd Author's Affiliation Chuo University (Chuo Univ.)
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Speaker Author-1 
Date Time 2011-12-15 16:00:00 
Presentation Time 30 minutes 
Registration for MRIS 
Paper # MR2011-30 
Volume (vol) vol.111 
Number (no) no.350 
Page pp.33-40 
#Pages 8 
Date of Issue 2011-12-08 (MR) 

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