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Presentation 2011-12-15 16:10
[Poster Presentation] Sleep Depth Controlling for Run-Time Leakage Power Saving
Seidai Takeda, Shinobu Miwa, Hiroshi Nakamura (Tokyo Univ.) ICD2011-114 Link to ES Tech. Rep. Archives: ICD2011-114
Abstract (in Japanese) (See Japanese page) 
(in English) Since process technology has been in deep sub-micron era, leakage power dissipation is one of major concerns, and its reduction is an essential issue in VSLI design. Body Biasing and Power Gating are well known techniques to save leakage power in standby-time. However, in run-time, its large overhead energy consumption and large latency for sleep control prevent a circuit from saving leakage power in short idle times. Recently, to achieve leakage saving in short idle times, advanced PG and BB using shallow depth sleep which provides smaller overheads than the conventional deep sleep are studied. A shallower sleep provides smaller overheads. Meanwhile, a shallow sleep has less leakage saving efficiency than a deeper sleep. Thus, the decision of sleep depth is highly-influential issue for total leakage power saving. We propose the circuit having multiple sleep modes which are capable of reconfiguring those depths. Proposed circuit achieves good leakage saving by adopting those depths with run-time factors, i.e. running application and temperature. In addition, we propose the sleep mode controlling method for our circuit. This method assigns optimal sleep mode for idle times in run-time by assessing those lengths.
Keyword (in Japanese) (See Japanese page) 
(in English) Body Biasing / Power Gating / Multi-mode Sleep / Leakage Power / / / /  
Reference Info. IEICE Tech. Rep., vol. 111, no. 352, ICD2011-114, pp. 69-69, Dec. 2011.
Paper # ICD2011-114 
Date of Issue 2011-12-08 (ICD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ICD2011-114 Link to ES Tech. Rep. Archives: ICD2011-114

Conference Information
Committee ICD  
Conference Date 2011-12-15 - 2011-12-16 
Place (in Japanese) (See Japanese page) 
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Paper Information
Registration To ICD 
Conference Code 2011-12-ICD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Sleep Depth Controlling for Run-Time Leakage Power Saving 
Sub Title (in English)  
Keyword(1) Body Biasing  
Keyword(2) Power Gating  
Keyword(3) Multi-mode Sleep  
Keyword(4) Leakage Power  
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1st Author's Name Seidai Takeda  
1st Author's Affiliation The University of Tokyo (Tokyo Univ.)
2nd Author's Name Shinobu Miwa  
2nd Author's Affiliation The University of Tokyo (Tokyo Univ.)
3rd Author's Name Hiroshi Nakamura  
3rd Author's Affiliation The University of Tokyo (Tokyo Univ.)
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Speaker Author-1 
Date Time 2011-12-15 16:10:00 
Presentation Time 110 minutes 
Registration for ICD 
Paper # ICD2011-114 
Volume (vol) vol.111 
Number (no) no.352 
Page p.69 
#Pages
Date of Issue 2011-12-08 (ICD) 


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