| IEICE Technical Committee Submission System Conference Paper's Information |
Online Proceedings [Sign in] Tech. Rep. Archives |
| Go Top Page | Go Previous | [Japanese] / [English] |
| Paper Abstract and Keywords | ||
| Presentation | 2011-12-16 13:55 Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism -- Contact Resistance and its model (19) -- Shin-ichi Wada, Saindaa Norovling, Keiji Koshida, Masahiro Kawanobe, Naoki Masuda, Hiroaki Kubota (TMC), Koichiro Sawa (NIT)  EMD2011-108 Link to ES Tech. Rep. Archives: EMD2011-108 |
|
| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some oscillating mechanisms in the vertical direction. In this paper, the authors discussed the difference of time-sequential fluctuations in the contact resistance when contact frictional force between male-pins and female-pins were “usual”, “smaller” or their “middle”, using hammering oscillating mechanism. It was shown that the contact resistance was increasing and fluctuating under the “middle” friction. In comparison to micro-sliding mechanism, it was indicated that the difference of the contact frictional force was related to degradation phenomenon of electrical contacts and there was relative displacement between male-pins and female-pins by oscillations using hammering oscillating mechanism with 150G. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | electrical contact / micro-oscillation / contact resistance / micro-sliding mechanism / hammering oscillating mechanism / contact frictional force / relative displacement / | |
| Reference Info. | IEICE Tech. Rep., vol. 111, no. 356, EMD2011-108, pp. 11-16, Dec. 2011. | |
| Paper # | EMD2011-108 | |
| Date of Issue | 2011-12-09 (EMD) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | EMD2011-108 Link to ES Tech. Rep. Archives: EMD2011-108 |
|
| Conference Information | |
| Committee | EMD |
| Conference Date | 2011-12-16 - 2011-12-16 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | NIT Kanda Camps |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Electromechanical Devices |
| Paper Information | |
| Registration To | EMD |
| Conference Code | 2011-12-EMD |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism |
| Sub Title (in English) | Contact Resistance and its model (19) |
| Keyword(1) | electrical contact |
| Keyword(2) | micro-oscillation |
| Keyword(3) | contact resistance |
| Keyword(4) | micro-sliding mechanism |
| Keyword(5) | hammering oscillating mechanism |
| Keyword(6) | contact frictional force |
| Keyword(7) | relative displacement |
| Keyword(8) | |
| 1st Author's Name | Shin-ichi Wada |
| 1st Author's Affiliation | TMC System Co. Ltd. (TMC) |
| 2nd Author's Name | Saindaa Norovling |
| 2nd Author's Affiliation | TMC System Co. Ltd. (TMC) |
| 3rd Author's Name | Keiji Koshida |
| 3rd Author's Affiliation | TMC System Co. Ltd. (TMC) |
| 4th Author's Name | Masahiro Kawanobe |
| 4th Author's Affiliation | TMC System Co. Ltd. (TMC) |
| 5th Author's Name | Naoki Masuda |
| 5th Author's Affiliation | TMC System Co. Ltd. (TMC) |
| 6th Author's Name | Hiroaki Kubota |
| 6th Author's Affiliation | TMC System Co. Ltd. (TMC) |
| 7th Author's Name | Koichiro Sawa |
| 7th Author's Affiliation | Nippon Institute of Technology (NIT) |
| 8th Author's Name | |
| 8th Author's Affiliation | () |
| 9th Author's Name | |
| 9th Author's Affiliation | () |
| 10th Author's Name | |
| 10th Author's Affiliation | () |
| 11th Author's Name | |
| 11th Author's Affiliation | () |
| 12th Author's Name | |
| 12th Author's Affiliation | () |
| 13th Author's Name | |
| 13th Author's Affiliation | () |
| 14th Author's Name | |
| 14th Author's Affiliation | () |
| 15th Author's Name | |
| 15th Author's Affiliation | () |
| 16th Author's Name | |
| 16th Author's Affiliation | () |
| 17th Author's Name | |
| 17th Author's Affiliation | () |
| 18th Author's Name | |
| 18th Author's Affiliation | () |
| Speaker | Author-1 |
| Date Time | 2011-12-16 13:55:00 |
| Presentation Time | 25 minutes |
| Registration for | EMD |
| Paper # | EMD2011-108 |
| Volume (vol) | vol.111 |
| Number (no) | no.356 |
| Page | pp.11-16 |
| #Pages | 6 |
| Date of Issue | 2011-12-09 (EMD) |
[Return to Top Page]