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Paper Abstract and Keywords
Presentation 2012-01-20 13:35
Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism -- Contact Resistance and its model (20) --
Shin-ichi Wada, Keiji Koshida, Masahiro Kawanobe, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2011-112
Abstract (in Japanese) (See Japanese page) 
(in English) Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some oscillating mechanisms in the vertical direction. In this paper, the authors discussed the correlation between input waveform into the mechanism, contact frictional force between male-pins and female-pins and sliding amplitude caused by the mechanism, using a reinforced micro-sliding mechanism. It was shown that there were lower critical points in the sliding amplitudes caused time sequential fluctuation of electrical contacts. It was, however, indicated that it was necessary to discuss more precisely about the amplitudes because some inhibitors were in the measured data.
Keyword (in Japanese) (See Japanese page) 
(in English) electrical contact / micro-oscillation / contact resistance / micro-sliding mechanism / hammering oscillating mechanism / contact frictional force / relative displacement / input waveform  
Reference Info. IEICE Tech. Rep., vol. 111, no. 391, EMD2011-112, pp. 1-6, Jan. 2012.
Paper # EMD2011-112 
Date of Issue 2012-01-13 (EMD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
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reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee EMD  
Conference Date 2012-01-20 - 2012-01-20 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMD 
Conference Code 2012-01-EMD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism 
Sub Title (in English) Contact Resistance and its model (20) 
Keyword(1) electrical contact  
Keyword(2) micro-oscillation  
Keyword(3) contact resistance  
Keyword(4) micro-sliding mechanism  
Keyword(5) hammering oscillating mechanism  
Keyword(6) contact frictional force  
Keyword(7) relative displacement  
Keyword(8) input waveform  
1st Author's Name Shin-ichi Wada  
1st Author's Affiliation TMC System Co. Ltd. (TMC)
2nd Author's Name Keiji Koshida  
2nd Author's Affiliation TMC System Co. Ltd. (TMC)
3rd Author's Name Masahiro Kawanobe  
3rd Author's Affiliation TMC System Co. Ltd. (TMC)
4th Author's Name Saindaa Norovling  
4th Author's Affiliation TMC System Co. Ltd. (TMC)
5th Author's Name Naoki Masuda  
5th Author's Affiliation TMC System Co. Ltd. (TMC)
6th Author's Name Akira Ishiguro  
6th Author's Affiliation TMC System Co. Ltd. (TMC)
7th Author's Name Kunio Yanagi  
7th Author's Affiliation TMC System Co. Ltd. (TMC)
8th Author's Name Hiroaki Kubota  
8th Author's Affiliation TMC System Co. Ltd. (TMC)
9th Author's Name Koichiro Sawa  
9th Author's Affiliation Nippon Institute of Technology (NIT)
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Speaker Author-1 
Date Time 2012-01-20 13:35:00 
Presentation Time 25 minutes 
Registration for EMD 
Paper # EMD2011-112 
Volume (vol) vol.111 
Number (no) no.391 
Page pp.1-6 
#Pages 6 
Date of Issue 2012-01-13 (EMD) 

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