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Paper Abstract and Keywords
Presentation 2012-02-13 11:30
Note on Layout-Aware High Accuracy Estimation of Fault Coverage
Masayuki Arai, Yoshihiro Shimizu, Kazuhiko Iwasaki (Tokyo Metro. Univ.) DC2011-79
Abstract (in Japanese) (See Japanese page) 
(in English) Shrinking feature size and higher integration on semiconductor device manufacturing technology bring a problem of the gap between the defect level estimated at the design stage from the reported one for fabricated devices. In this study, as one possible strategy to accurately estimate the defect level, we discuss on a fault coverage estimation with more accuracy for the given test pattern set. For each possible wire and wire pair in a given layout data, we execute critical area analysis multiple times, assuming different defect sizes. On the basis of critical areas obtained, we calculate weighted open/bridge fault coverages, considering frequency of occurrence of each fault.
Keyword (in Japanese) (See Japanese page) 
(in English) weighted bridge fault coverage / weighted open fault coverage / layout-aware / critical area / / / /  
Reference Info. IEICE Tech. Rep., vol. 111, no. 435, DC2011-79, pp. 19-24, Feb. 2012.
Paper # DC2011-79 
Date of Issue 2012-02-06 (DC) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF DC2011-79

Conference Information
Committee DC  
Conference Date 2012-02-13 - 2012-02-13 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To DC 
Conference Code 2012-02-DC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Note on Layout-Aware High Accuracy Estimation of Fault Coverage 
Sub Title (in English)  
Keyword(1) weighted bridge fault coverage  
Keyword(2) weighted open fault coverage  
Keyword(3) layout-aware  
Keyword(4) critical area  
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1st Author's Name Masayuki Arai  
1st Author's Affiliation Tokyo Metropolitan University (Tokyo Metro. Univ.)
2nd Author's Name Yoshihiro Shimizu  
2nd Author's Affiliation Tokyo Metropolitan University (Tokyo Metro. Univ.)
3rd Author's Name Kazuhiko Iwasaki  
3rd Author's Affiliation Tokyo Metropolitan University (Tokyo Metro. Univ.)
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Speaker Author-1 
Date Time 2012-02-13 11:30:00 
Presentation Time 25 minutes 
Registration for DC 
Paper # DC2011-79 
Volume (vol) vol.111 
Number (no) no.435 
Page pp.19-24 
#Pages 6 
Date of Issue 2012-02-06 (DC) 

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