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| Presentation | 2012-03-03 14:00 Time Division Method of Detecting Fault of RAM by Software Ryoya Ichioka (Mitsubishi Electric)  CPSY2011-93 DC2011-97 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | We're developing about the RAM test for an embedded systems. Traditional RAM test can't be executed with other software because it changes among RAM data, its processing time is too long, and can't be executed in lots. In an embedded system, traditional RAM test must be excecuted dedicated time beacause it can’t be excecuted in short period time (distinctive of an embedded system). Therefore the rate of operation falls off. In this paper, we suggest time division RAM test by software “TD-Abraham” which expanded traditional RAM test "Abraham". TD-Abraham can prevent the decline of rate of operation. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | RAM / Test / Time Division / IEC 61508 / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 111, no. 462, DC2011-97, pp. 205-209, March 2012. | |
| Paper # | DC2011-97 | |
| Date of Issue | 2012-02-24 (CPSY, DC) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | CPSY2011-93 DC2011-97 |
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| Conference Information | |
| Committee | CPSY DC IPSJ-SLDM IPSJ-EMB |
| Conference Date | 2012-03-02 - 2012-03-03 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | DC |
| Conference Code | 2012-03-CPSY-DC-SLDM-EMB |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Time Division Method of Detecting Fault of RAM by Software |
| Sub Title (in English) | |
| Keyword(1) | RAM |
| Keyword(2) | Test |
| Keyword(3) | Time Division |
| Keyword(4) | IEC 61508 |
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| 1st Author's Name | Ryoya Ichioka |
| 1st Author's Affiliation | Mitsubishi Electric Corporation (Mitsubishi Electric) |
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| Speaker | Author-1 |
| Date Time | 2012-03-03 14:00:00 |
| Presentation Time | 30 minutes |
| Registration for | DC |
| Paper # | CPSY2011-93, DC2011-97 |
| Volume (vol) | vol.111 |
| Number (no) | no.461(CPSY), no.462(DC) |
| Page | pp.205-209 |
| #Pages | 5 |
| Date of Issue | 2012-02-24 (CPSY, DC) |
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