Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2012-03-14 11:15
A Technique for Locating Features in Multi-Layer Systems Based on Formal Concept Analysis
Hiroshi Kazato (NTT), Shinpei Hayashi (Tokyo Tech), Satoshi Okada, Shunsuke Miyata, Takashi Hoshino (NTT), Motoshi Saeki (Tokyo Tech) SS2011-80
Abstract (in Japanese) (See Japanese page) 
(in English) In multi-layer systems such as web applications, locating features is a challenging problem because each feature is often realized through a collaboration of program elements belonging to different layers. This paper proposes a semi-automatic technique to extract correspondence between features and program elements among layers, by merging execution traces of every layer to feed into formal concept analysis. To show the feasibility of our technique, we applied it to a web application which conforms to the typical three-layer architecture of Java EE and discuss its applicability to other layer systems in the real world.
Keyword (in Japanese) (See Japanese page) 
(in English) Feature Location / Multi-Layer System / Dynamic Analysis / Formal Concept Analysis / / / /  
Reference Info. IEICE Tech. Rep., vol. 111, no. 481, SS2011-80, pp. 139-144, March 2012.
Paper # SS2011-80 
Date of Issue 2012-03-06 (SS) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SS2011-80

Conference Information
Committee SS  
Conference Date 2012-03-13 - 2012-03-14 
Place (in Japanese) (See Japanese page) 
Place (in English) Tenbusu-Naha 
Topics (in Japanese) (See Japanese page) 
Topics (in English) General topics 
Paper Information
Registration To SS 
Conference Code 2012-03-SS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Technique for Locating Features in Multi-Layer Systems Based on Formal Concept Analysis 
Sub Title (in English)  
Keyword(1) Feature Location  
Keyword(2) Multi-Layer System  
Keyword(3) Dynamic Analysis  
Keyword(4) Formal Concept Analysis  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Hiroshi Kazato  
1st Author's Affiliation NTT Cyber Space Laboratories (NTT)
2nd Author's Name Shinpei Hayashi  
2nd Author's Affiliation Tokyo Institute of Technology (Tokyo Tech)
3rd Author's Name Satoshi Okada  
3rd Author's Affiliation NTT Cyber Space Laboratories (NTT)
4th Author's Name Shunsuke Miyata  
4th Author's Affiliation NTT Cyber Space Laboratories (NTT)
5th Author's Name Takashi Hoshino  
5th Author's Affiliation NTT Cyber Space Laboratories (NTT)
6th Author's Name Motoshi Saeki  
6th Author's Affiliation Tokyo Institute of Technology (Tokyo Tech)
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2012-03-14 11:15:00 
Presentation Time 25 minutes 
Registration for SS 
Paper # SS2011-80 
Volume (vol) vol.111 
Number (no) no.481 
Page pp.139-144 
#Pages 6 
Date of Issue 2012-03-06 (SS) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan