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Paper Abstract and Keywords
Presentation 2012-04-20 13:50
Placement optimization of the ground pins based on the measurement results of the currents flowing through each ground pin
Takeshi Nakayama, Daisaku Kitagawa, Masahiro Ishii, Yoshiyuki Saito (Panasonic) EMCJ2012-4
Abstract (in Japanese) (See Japanese page) 
(in English) To maintain operational stability of LSI, power supply and ground pin count has increased. This is one of the factors of LSI cost increase. So, we are imploving the BGA Current Probe to observe the high frequency current of every pin, including the ground pins, of BGA package. In this paper, we report the structure of improved probe and the measurement result of the high frequency current using it.
Keyword (in Japanese) (See Japanese page) 
(in English) BGA / Package / Current / Current Probe / / / /  
Reference Info. IEICE Tech. Rep., vol. 112, no. 12, EMCJ2012-4, pp. 19-24, April 2012.
Paper # EMCJ2012-4 
Date of Issue 2012-04-13 (EMCJ) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMCJ2012-4

Conference Information
Committee EMCJ  
Conference Date 2012-04-20 - 2012-04-20 
Place (in Japanese) (See Japanese page) 
Place (in English) Kanazawa Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMCJ 
Conference Code 2012-04-EMCJ 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Placement optimization of the ground pins based on the measurement results of the currents flowing through each ground pin 
Sub Title (in English)  
Keyword(1) BGA  
Keyword(2) Package  
Keyword(3) Current  
Keyword(4) Current Probe  
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1st Author's Name Takeshi Nakayama  
1st Author's Affiliation Panasonic Corporation (Panasonic)
2nd Author's Name Daisaku Kitagawa  
2nd Author's Affiliation Panasonic Corporation (Panasonic)
3rd Author's Name Masahiro Ishii  
3rd Author's Affiliation Panasonic Corporation (Panasonic)
4th Author's Name Yoshiyuki Saito  
4th Author's Affiliation Panasonic Corporation (Panasonic)
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Speaker Author-4 
Date Time 2012-04-20 13:50:00 
Presentation Time 25 minutes 
Registration for EMCJ 
Paper # EMCJ2012-4 
Volume (vol) vol.112 
Number (no) no.12 
Page pp.19-24 
#Pages 6 
Date of Issue 2012-04-13 (EMCJ) 

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