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Paper Abstract and Keywords
Presentation 2012-05-24 16:15
Forming of Transfer Region in The Interface Between Fluorinated Self Assembled Monolayer and Hole Transport Layer
Tomoya Inden (Nagoya Univ.), Toshikazu Satoh (Toyota Central R & D Labs., Inc.), Takuya Morimoto (Nagoya Univ.), Takao Nishikawa (Iwate Univ.), Tatsuo Mori (AIT/Nagoya Univ.) OME2012-29
Abstract (in Japanese) (See Japanese page) 
(in English) We have already reported that the introduction of fluorinated self-assembled monolayer (FSAM) leads to reduce driving voltage and improve lifetime for organic light-emitting diodes (OLEDs). The capacitance of the OLED with FSAM was higher than that of the OLED without FSAM when we used (N,N’-bis(1-naphthyl)-N,N’-bis(phenyl)-benzidine)(α-NPD) on FSAM layer. The dielectric constant of the localized α-NPD layer near FSAM was found to increase by analyzing thickness dependence of α-NPD layer and ultra-violet photoelectron spectroscopy. We directly showed the existence of two regions, the region of high dielectric constant and the region of a normal dielectric constant in α-NPD layer on FSAM from the impedance measurement.
Keyword (in Japanese) (See Japanese page) 
(in English) Self-Assembled Monolayer / Capacitance / Ultra-Violet Photoelectron Spectroscopy / Impedance Measurement / Polarization / / /  
Reference Info. IEICE Tech. Rep., vol. 112, no. 57, OME2012-29, pp. 49-52, May 2012.
Paper # OME2012-29 
Date of Issue 2012-05-17 (OME) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
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reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee OME  
Conference Date 2012-05-24 - 2012-05-24 
Place (in Japanese) (See Japanese page) 
Place (in English) NTT Musashino Research and Development Center 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Organic Materials; Preparation, Characterization and Related Topics 
Paper Information
Registration To OME 
Conference Code 2012-05-OME 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Forming of Transfer Region in The Interface Between Fluorinated Self Assembled Monolayer and Hole Transport Layer 
Sub Title (in English)  
Keyword(1) Self-Assembled Monolayer  
Keyword(2) Capacitance  
Keyword(3) Ultra-Violet Photoelectron Spectroscopy  
Keyword(4) Impedance Measurement  
Keyword(5) Polarization  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Tomoya Inden  
1st Author's Affiliation Nagoya University (Nagoya Univ.)
2nd Author's Name Toshikazu Satoh  
2nd Author's Affiliation Toyota central Research and Development Laboratries Incorporated (Toyota Central R & D Labs., Inc.)
3rd Author's Name Takuya Morimoto  
3rd Author's Affiliation Nagoya University (Nagoya Univ.)
4th Author's Name Takao Nishikawa  
4th Author's Affiliation Iwate University (Iwate Univ.)
5th Author's Name Tatsuo Mori  
5th Author's Affiliation Aichi Institute of Technology/Nagoya University (AIT/Nagoya Univ.)
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Speaker Author-1 
Date Time 2012-05-24 16:15:00 
Presentation Time 15 minutes 
Registration for OME 
Paper # OME2012-29 
Volume (vol) vol.112 
Number (no) no.57 
Page pp.49-52 
#Pages 4 
Date of Issue 2012-05-17 (OME) 

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