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| Presentation | 2012-06-22 13:00 An evaluation of a don't care filling method to improve fault sensitization coverage Ryosuke Wakasugi, Toshinori Hosokawa (Nihon Univ), Masayoshi Yoshimura (Kyusyu Univ)  DC2012-9 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | A single stuck-at fault model and a transition fault model have been widely used to generate test patterns for VLSIs. However, recently defects which are not detected by test sets for the classical fault models increase with the growing density and complexity of VLSIs. In this paper, fault sensitization coverage is defined as the simple measure of test quality for a small delay fault. Defects which frequently occur in VLSIs is modeled as a small delay fault and the detection conditions are complex. This paper proposes a don't care filling method to improve fault sensitization coverage for given initial transition fault test sets. This method is possible to generate high quality test sets for small delay without any impact on test data volume. Experimental results show that final test sets generated by the proposed don't care filling method improved SDQL by 0.2~7.0% compared with given initial transition fault sets. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | transition fault / test quality / fault sensitization coverage / small delay faults / SDQL / don't care filling / / | |
| Reference Info. | IEICE Tech. Rep., vol. 112, no. 102, DC2012-9, pp. 1-6, June 2012. | |
| Paper # | DC2012-9 | |
| Date of Issue | 2012-06-15 (DC) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | DC2012-9 |
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| Conference Information | |
| Committee | DC |
| Conference Date | 2012-06-22 - 2012-06-22 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Room B3-1 Kikai-Shinko-Kaikan Bldg |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Design, Test, Verification |
| Paper Information | |
| Registration To | DC |
| Conference Code | 2012-06-DC |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | An evaluation of a don't care filling method to improve fault sensitization coverage |
| Sub Title (in English) | |
| Keyword(1) | transition fault |
| Keyword(2) | test quality |
| Keyword(3) | fault sensitization coverage |
| Keyword(4) | small delay faults |
| Keyword(5) | SDQL |
| Keyword(6) | don't care filling |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Ryosuke Wakasugi |
| 1st Author's Affiliation | Nihon University (Nihon Univ) |
| 2nd Author's Name | Toshinori Hosokawa |
| 2nd Author's Affiliation | Nihon University (Nihon Univ) |
| 3rd Author's Name | Masayoshi Yoshimura |
| 3rd Author's Affiliation | Kyusyu University (Kyusyu Univ) |
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| Speaker | Author-1 |
| Date Time | 2012-06-22 13:00:00 |
| Presentation Time | 25 minutes |
| Registration for | DC |
| Paper # | DC2012-9 |
| Volume (vol) | vol.112 |
| Number (no) | no.102 |
| Page | pp.1-6 |
| #Pages | 6 |
| Date of Issue | 2012-06-15 (DC) |
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