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Paper Abstract and Keywords
Presentation 2012-07-19 14:55
Measurement of Complex Near EM-fields by Using 6-port Fabricated with Broadband Hybrids
Takayuki Nambu, Yoshio Kami, Fengchao Xiao (UEC), Kimitoshi Murano (Tokai Univ.) EMCJ2012-36
Abstract (in Japanese) (See Japanese page) 
(in English) A method for measuring complex electromagnetic (EM) fields near a circuit board is described. Six-port circuit technology is developed as an alternative way of vector network analyzer (VNA) for estimating the scattering matrix of a device under test (DUT) from measuring powers at four output ports. In this report, the technology is applied to the measurement of EM fields near circuit boards. Two magnetic probes are connected to input ports, where equivalent voltage sources are expressed in phasor due to magnetic fields picked up by the probes. Powers at four output-port loads can be formulated in four unknown terms of magnitudes and phases of the sources, though such equation would fall into an ill-condition problem when solving the unknown terms. To avoid the ill condition, the six-port network with applying some design conditions is proposed. The magnitude ratio and the phase difference between two magnetic fields near a ground slit under a microstrip line are estimated and compared with those directly obtained by a VNA. The results are in a good agreement.
Keyword (in Japanese) (See Japanese page) 
(in English) Complex Near EM-fields / 6-port network / scattering matrix / $90^{\circ}$ hybrid / $180^{\circ}$ hybrid / / /  
Reference Info. IEICE Tech. Rep., vol. 112, no. 130, EMCJ2012-36, pp. 23-28, July 2012.
Paper # EMCJ2012-36 
Date of Issue 2012-07-12 (EMCJ) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
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reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee EMCJ  
Conference Date 2012-07-19 - 2012-07-19 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Young Scientists meeting 
Paper Information
Registration To EMCJ 
Conference Code 2012-07-EMCJ 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Measurement of Complex Near EM-fields by Using 6-port Fabricated with Broadband Hybrids 
Sub Title (in English)  
Keyword(1) Complex Near EM-fields  
Keyword(2) 6-port network  
Keyword(3) scattering matrix  
Keyword(4) $90^{\circ}$ hybrid  
Keyword(5) $180^{\circ}$ hybrid  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Takayuki Nambu  
1st Author's Affiliation The University of Electro-Communications (UEC)
2nd Author's Name Yoshio Kami  
2nd Author's Affiliation The University of Electro-Communications (UEC)
3rd Author's Name Fengchao Xiao  
3rd Author's Affiliation The University of Electro-Communications (UEC)
4th Author's Name Kimitoshi Murano  
4th Author's Affiliation Tokai University (Tokai Univ.)
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Speaker Author-1 
Date Time 2012-07-19 14:55:00 
Presentation Time 25 minutes 
Registration for EMCJ 
Paper # EMCJ2012-36 
Volume (vol) vol.112 
Number (no) no.130 
Page pp.23-28 
#Pages 6 
Date of Issue 2012-07-12 (EMCJ) 

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