Paper Abstract and Keywords |
Presentation |
2012-08-24 17:40
Modeling for Semiconductor Characteristics of Electrical Contact Resistance between Rail and Wheel Takashi Toyama, Mitsuyoshi Fukuda, Kosuke Owada, Hiroyuki Fujita (RTRI) R2012-53 EMD2012-59 CPM2012-84 OPE2012-91 LQE2012-57 Link to ES Tech. Rep. Archives: EMD2012-59 CPM2012-84 OPE2012-91 LQE2012-57 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
In railway signalling systems, track circuits based on an electrical shunting principle are used to detect the presence of a train within a particular track section. An increase of contact resistances between rail and wheel makes the detection difficult. Therefore, it is important to quantitatively estimate the contact resistances in order to detect trains exactly. The contact resistances may behave like semiconductors, but their semiconductor characteristics have not been sufficiently studied for the quantitative estimation. In this paper, we propose electrical-circuit models for the semiconductor characteristics, and show their performance based on comparison with measurement data. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Railway Signalling / Wheel-rail Contact / Shunting Malfunction / Contact Resistance / Rust / / / |
Reference Info. |
IEICE Tech. Rep., vol. 112, no. 181, EMD2012-59, pp. 157-162, Aug. 2012. |
Paper # |
EMD2012-59 |
Date of Issue |
2012-08-16 (R, EMD, CPM, OPE, LQE) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
R2012-53 EMD2012-59 CPM2012-84 OPE2012-91 LQE2012-57 Link to ES Tech. Rep. Archives: EMD2012-59 CPM2012-84 OPE2012-91 LQE2012-57 |
Conference Information |
Committee |
LQE CPM EMD OPE R |
Conference Date |
2012-08-23 - 2012-08-24 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Tohoku Univ. |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
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Paper Information |
Registration To |
EMD |
Conference Code |
2012-08-LQE-CPM-EMD-OPE-R |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Modeling for Semiconductor Characteristics of Electrical Contact Resistance between Rail and Wheel |
Sub Title (in English) |
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Keyword(1) |
Railway Signalling |
Keyword(2) |
Wheel-rail Contact |
Keyword(3) |
Shunting Malfunction |
Keyword(4) |
Contact Resistance |
Keyword(5) |
Rust |
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1st Author's Name |
Takashi Toyama |
1st Author's Affiliation |
Railway Technical Research Institute (RTRI) |
2nd Author's Name |
Mitsuyoshi Fukuda |
2nd Author's Affiliation |
Railway Technical Research Institute (RTRI) |
3rd Author's Name |
Kosuke Owada |
3rd Author's Affiliation |
Railway Technical Research Institute (RTRI) |
4th Author's Name |
Hiroyuki Fujita |
4th Author's Affiliation |
Railway Technical Research Institute (RTRI) |
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Speaker |
Author-1 |
Date Time |
2012-08-24 17:40:00 |
Presentation Time |
25 minutes |
Registration for |
EMD |
Paper # |
R2012-53, EMD2012-59, CPM2012-84, OPE2012-91, LQE2012-57 |
Volume (vol) |
vol.112 |
Number (no) |
no.180(R), no.181(EMD), no.182(CPM), no.183(OPE), no.184(LQE) |
Page |
pp.157-162 |
#Pages |
6 |
Date of Issue |
2012-08-16 (R, EMD, CPM, OPE, LQE) |
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