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Paper Abstract and Keywords
Presentation 2012-08-24 17:40
Modeling for Semiconductor Characteristics of Electrical Contact Resistance between Rail and Wheel
Takashi Toyama, Mitsuyoshi Fukuda, Kosuke Owada, Hiroyuki Fujita (RTRI) R2012-53 EMD2012-59 CPM2012-84 OPE2012-91 LQE2012-57
Abstract (in Japanese) (See Japanese page) 
(in English) In railway signalling systems, track circuits based on an electrical shunting principle are used to detect the presence of a train within a particular track section. An increase of contact resistances between rail and wheel makes the detection difficult. Therefore, it is important to quantitatively estimate the contact resistances in order to detect trains exactly. The contact resistances may behave like semiconductors, but their semiconductor characteristics have not been sufficiently studied for the quantitative estimation. In this paper, we propose electrical-circuit models for the semiconductor characteristics, and show their performance based on comparison with measurement data.
Keyword (in Japanese) (See Japanese page) 
(in English) Railway Signalling / Wheel-rail Contact / Shunting Malfunction / Contact Resistance / Rust / / /  
Reference Info. IEICE Tech. Rep., vol. 112, no. 181, EMD2012-59, pp. 157-162, Aug. 2012.
Paper # EMD2012-59 
Date of Issue 2012-08-16 (R, EMD, CPM, OPE, LQE) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF R2012-53 EMD2012-59 CPM2012-84 OPE2012-91 LQE2012-57

Conference Information
Committee LQE CPM EMD OPE R  
Conference Date 2012-08-23 - 2012-08-24 
Place (in Japanese) (See Japanese page) 
Place (in English) Tohoku Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMD 
Conference Code 2012-08-LQE-CPM-EMD-OPE-R 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Modeling for Semiconductor Characteristics of Electrical Contact Resistance between Rail and Wheel 
Sub Title (in English)  
Keyword(1) Railway Signalling  
Keyword(2) Wheel-rail Contact  
Keyword(3) Shunting Malfunction  
Keyword(4) Contact Resistance  
Keyword(5) Rust  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Takashi Toyama  
1st Author's Affiliation Railway Technical Research Institute (RTRI)
2nd Author's Name Mitsuyoshi Fukuda  
2nd Author's Affiliation Railway Technical Research Institute (RTRI)
3rd Author's Name Kosuke Owada  
3rd Author's Affiliation Railway Technical Research Institute (RTRI)
4th Author's Name Hiroyuki Fujita  
4th Author's Affiliation Railway Technical Research Institute (RTRI)
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Speaker Author-1 
Date Time 2012-08-24 17:40:00 
Presentation Time 25 minutes 
Registration for EMD 
Paper # R2012-53, EMD2012-59, CPM2012-84, OPE2012-91, LQE2012-57 
Volume (vol) vol.112 
Number (no) no.180(R), no.181(EMD), no.182(CPM), no.183(OPE), no.184(LQE) 
Page pp.157-162 
#Pages 6 
Date of Issue 2012-08-16 (R, EMD, CPM, OPE, LQE) 

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