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Paper Abstract and Keywords
Presentation 2012-10-25 13:35
LECCS-core Model Representing the Effect of Fluctuations in Supply Voltage by High-Frequency Current
Ayumu Izuhara, Teruyoshi Yamasaki, Tohlu Matsushima, Takashi Hisakado, Osami Wada (Kyoto Univ.) EMCJ2012-69 EST2012-53
Abstract (in Japanese) (See Japanese page) 
(in English) For simulating high-frequency power-supply currents generated by an LSI chip, EMC macro-model called LECCS model composed of a linear equivalent circuit and internal equivalent current sources was proposed. This LECCS model has been extracted in the condition that supply voltage remains steady. However, supply voltage fluctuates depending on the high-frequency currents on the power distribution network (PDN). In this report, the authors propose a modeling method in which a LECCS model for each block unit is extracted from the design information of the LSI and
the sub-block models are combined to construct a functional block model
with the internal equivalent current sources representing the effect of fluctuations in supply voltage. Applying this method to a test chip designed by the authors, the LECCS model expresses high-frequency currents with good accuracy.
Keyword (in Japanese) (See Japanese page) 
(in English) EMC macro-model / high-frequency current / LECCS-core model / internal equivalent current source / supply voltage fluctuation / / /  
Reference Info. IEICE Tech. Rep., vol. 112, no. 256, EMCJ2012-69, pp. 31-36, Oct. 2012.
Paper # EMCJ2012-69 
Date of Issue 2012-10-18 (EMCJ, EST) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee EST EMCJ IEE-EMC  
Conference Date 2012-10-25 - 2012-10-26 
Place (in Japanese) (See Japanese page) 
Place (in English) Tohoku Gakuin University(Tagajo Campus) 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Simulation technology, EMC, etc. 
Paper Information
Registration To EMCJ 
Conference Code 2012-10-EST-EMCJ-EMC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) LECCS-core Model Representing the Effect of Fluctuations in Supply Voltage by High-Frequency Current 
Sub Title (in English)  
Keyword(1) EMC macro-model  
Keyword(2) high-frequency current  
Keyword(3) LECCS-core model  
Keyword(4) internal equivalent current source  
Keyword(5) supply voltage fluctuation  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Ayumu Izuhara  
1st Author's Affiliation Kyoto University (Kyoto Univ.)
2nd Author's Name Teruyoshi Yamasaki  
2nd Author's Affiliation Kyoto University (Kyoto Univ.)
3rd Author's Name Tohlu Matsushima  
3rd Author's Affiliation Kyoto University (Kyoto Univ.)
4th Author's Name Takashi Hisakado  
4th Author's Affiliation Kyoto University (Kyoto Univ.)
5th Author's Name Osami Wada  
5th Author's Affiliation Kyoto University (Kyoto Univ.)
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Speaker Author-1 
Date Time 2012-10-25 13:35:00 
Presentation Time 25 minutes 
Registration for EMCJ 
Paper # EMCJ2012-69, EST2012-53 
Volume (vol) vol.112 
Number (no) no.256(EMCJ), no.257(EST) 
Page pp.31-36 
#Pages
Date of Issue 2012-10-18 (EMCJ, EST) 


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