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Paper Abstract and Keywords
Presentation 2012-10-25 13:25
Improvement of the integrated cryogenic current comparator
Takahiro Yamada, Masaaki Maezawa, Michitaka Maruyama, Takehiko Oe, Chiharu Urano, Nobu-hisa Kaneko (AIST), Mutsuo Hidaka, Tetsuro Satoh, Shuichi Nagasawa, Kenji Hinode (ISTEC-SRL) SCE2012-18
Abstract (in Japanese) (See Japanese page) 
(in English) We improved performances of the integrated cryogenic current comparator (integrated CCC: ICCC) which was fabricated by using Nb multilayered fabrication process. The mutual inductance of the ICCC between input winding coils and a superconducting quantum interference device (SQUID) was in the range of 300 to 400 pH/turn, which is comparable to those of conventional bulky CCCs, 600 pH/turn. Also, winding turn errors on the order of 10-7 were obtained. In the future, more precise measurements are necessary. These thin-film-based ICCCs are reliable and compact, which means that they have advantages of integration with other devices using cryocoolers.
Keyword (in Japanese) (See Japanese page) 
(in English) Cryogenic current comparator / Integrated cryogenic current comparator / Superconducting circuit / Superconducting quantum interference device / Inductance / Chip carrier / Winding coil / Error  
Reference Info. IEICE Tech. Rep., vol. 112, no. 262, SCE2012-18, pp. 7-12, Oct. 2012.
Paper # SCE2012-18 
Date of Issue 2012-10-18 (SCE) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
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reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee SCE  
Conference Date 2012-10-25 - 2012-10-25 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Fundamental Technologies for Superconducting Electronics, etc. 
Paper Information
Registration To SCE 
Conference Code 2012-10-SCE 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Improvement of the integrated cryogenic current comparator 
Sub Title (in English)  
Keyword(1) Cryogenic current comparator  
Keyword(2) Integrated cryogenic current comparator  
Keyword(3) Superconducting circuit  
Keyword(4) Superconducting quantum interference device  
Keyword(5) Inductance  
Keyword(6) Chip carrier  
Keyword(7) Winding coil  
Keyword(8) Error  
1st Author's Name Takahiro Yamada  
1st Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
2nd Author's Name Masaaki Maezawa  
2nd Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
3rd Author's Name Michitaka Maruyama  
3rd Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
4th Author's Name Takehiko Oe  
4th Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
5th Author's Name Chiharu Urano  
5th Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
6th Author's Name Nobu-hisa Kaneko  
6th Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
7th Author's Name Mutsuo Hidaka  
7th Author's Affiliation Superconductivity Research Laboratory (ISTEC-SRL)
8th Author's Name Tetsuro Satoh  
8th Author's Affiliation Superconductivity Research Laboratory (ISTEC-SRL)
9th Author's Name Shuichi Nagasawa  
9th Author's Affiliation Superconductivity Research Laboratory (ISTEC-SRL)
10th Author's Name Kenji Hinode  
10th Author's Affiliation Superconductivity Research Laboratory (ISTEC-SRL)
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Speaker Author-1 
Date Time 2012-10-25 13:25:00 
Presentation Time 25 minutes 
Registration for SCE 
Paper # SCE2012-18 
Volume (vol) vol.112 
Number (no) no.262 
Page pp.7-12 
#Pages 6 
Date of Issue 2012-10-18 (SCE) 

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