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| Presentation | 2012-11-15 17:05 A Studay on Evaluation for PWB Sadanori Ito (itoken)  R2012-67 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | The evaluation test for the goods procurement from overseas is important because the estimation for the process control is difficult even though the process inspection. The most evaluation is set whether the test result meets the standard value or not. However, we propose the necessary test evaluation standard, because we may miss the important defect as the actual example. We also explain the teardown analysis importance for the tested sample. |
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| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | ｉｎｓｕｌａｔｉｏｎ ｆａｉｌｕｒｅ / ｉｏｎ-ｍｉｇｒａｔｉｏｎ / ｓｏｌｄｅｒ-ｒｅｓｉｓｔ / / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 112, no. 284, R2012-67, pp. 37-40, Nov. 2012. | |
| Paper # | R2012-67 | |
| Date of Issue | 2012-11-08 (R) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | R2012-67 |
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| Conference Information | |
| Committee | R |
| Conference Date | 2012-11-15 - 2012-11-15 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | R |
| Conference Code | 2012-11-R |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Studay on Evaluation for PWB |
| Sub Title (in English) | |
| Keyword(1) | ｉｎｓｕｌａｔｉｏｎ ｆａｉｌｕｒｅ |
| Keyword(2) | ｉｏｎ-ｍｉｇｒａｔｉｏｎ |
| Keyword(3) | ｓｏｌｄｅｒ-ｒｅｓｉｓｔ |
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| 1st Author's Name | Sadanori Ito |
| 1st Author's Affiliation | itoken office (itoken) |
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| Speaker | Author-1 |
| Date Time | 2012-11-15 17:05:00 |
| Presentation Time | 25 minutes |
| Registration for | R |
| Paper # | R2012-67 |
| Volume (vol) | vol.112 |
| Number (no) | no.284 |
| Page | pp.37-40 |
| #Pages | 4 |
| Date of Issue | 2012-11-08 (R) |
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