講演抄録/キーワード |
講演名 |
2012-11-27 13:00
Accurate I/O Buffer Impedance Self-adjustment using Threshold Voltage and Temperature Sensors ○Zhi Li・Hiroshi Tsutsui・Hiroyuki Ochi・Takashi Sato(Kyoto Univ.) VLD2012-79 DC2012-45 |
抄録 |
(和) |
With the increased operating frequency and the reduction of feature
size, achieving low error-rate data transmission between LSIs is an
important field of research. In particular, input/output (I/O) impedance
matching, as one of the necessary technologies for high-speed
transmission, is strongly required. In this paper, we propose an
architecture of output buffer whose impedance is self-adjustable against
process variation and temperature characteristic of MOS transistors. The
proposed architecture utilizes on-chip sensor circuits to capture
threshold voltages and temperatures. Based on a commercial 65nm CMOS
technology, the proposed method has been verified. Without the use of
reference resistor, it successfully adjusts the I/O impedance within
2.36 % and 1.4 % around a target of 50 $\Omega$ through simulation and
measurement, respectively, regardless of the process parameters and
temperature. |
(英) |
With the increased operating frequency and the reduction of feature
size, achieving low error-rate data transmission between LSIs is an
important field of research. In particular, input/output (I/O) impedance
matching, as one of the necessary technologies for high-speed
transmission, is strongly required. In this paper, we propose an
architecture of output buffer whose impedance is self-adjustable against
process variation and temperature characteristic of MOS transistors. The
proposed architecture utilizes on-chip sensor circuits to capture
threshold voltages and temperatures. Based on a commercial 65nm CMOS
technology, the proposed method has been verified. Without the use of
reference resistor, it successfully adjusts the I/O impedance within
2.36 % and 1.4 % around a target of 50 $\Omega$ through simulation and
measurement, respectively, regardless of the process parameters and
temperature. |
キーワード |
(和) |
プロセスばらつき / 閾値電圧ばらつき / 温度センサ / 精度向上 / インピーダンス整合 / 入出力インピーダンス / 入出力バッファ / |
(英) |
Process variation / Threshold-voltage variation / Temperature sensor / Accuracy improvement / Impedance Matching / Input and output impedance / Input and output impedance / |
文献情報 |
信学技報, vol. 112, no. 320, VLD2012-79, pp. 117-122, 2012年11月. |
資料番号 |
VLD2012-79 |
発行日 |
2012-11-19 (VLD, DC) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
著作権に ついて |
技術研究報告に掲載された論文の著作権は電子情報通信学会に帰属します.(許諾番号:10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
PDFダウンロード |
VLD2012-79 DC2012-45 |
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