IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2013-01-17 10:10
Automated GUI Testing by Exhaustive Operations and Retrieval for Operational Logs
Hajime Nakajima, Takeshi Masuda, Ikuya Takahashi (NTT) ICM2012-39 LOIS2012-49
Abstract (in Japanese) (See Japanese page) 
(in English) GUIs are implemented in many OSS and the GUI testing is essential to the development.
This study will realize a test method for GUIs that automates manipulations of possible UI elements exhaustively to each GUI appearance and retrieves operational logs accumulated through their manipulations. Our method allows us to introduce the exhaustive testing in test phases which target whole systems (system tests and acceptance tests), because no human effort is needed for manipulations of UI elements. In this paper, we propose and evaluate our algorithm manipulating UI elements to GUI appearances exhaustively.
Keyword (in Japanese) (See Japanese page) 
(in English) GUI testing / automatic operation / operational logs / / / / /  
Reference Info. IEICE Tech. Rep., vol. 112, no. 378, ICM2012-39, pp. 13-18, Jan. 2013.
Paper # ICM2012-39 
Date of Issue 2013-01-10 (ICM, LOIS) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ICM2012-39 LOIS2012-49

Conference Information
Committee ICM LOIS  
Conference Date 2013-01-17 - 2013-01-18 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To ICM 
Conference Code 2013-01-ICM-LOIS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Automated GUI Testing by Exhaustive Operations and Retrieval for Operational Logs 
Sub Title (in English)  
Keyword(1) GUI testing  
Keyword(2) automatic operation  
Keyword(3) operational logs  
Keyword(4)  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Hajime Nakajima  
1st Author's Affiliation Nippon Telegraph and Telephone Corporation (NTT)
2nd Author's Name Takeshi Masuda  
2nd Author's Affiliation Nippon Telegraph and Telephone Corporation (NTT)
3rd Author's Name Ikuya Takahashi  
3rd Author's Affiliation Nippon Telegraph and Telephone Corporation (NTT)
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2013-01-17 10:10:00 
Presentation Time 20 minutes 
Registration for ICM 
Paper # ICM2012-39, LOIS2012-49 
Volume (vol) vol.112 
Number (no) no.378(ICM), no.379(LOIS) 
Page pp.13-18 
#Pages
Date of Issue 2013-01-10 (ICM, LOIS) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan