Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2013-01-24 09:50
Integrated quantum voltage noise source for Johnson noise thermometry
Masaaki Maezawa, Takahiro Yamada, Chiharu Urano (AIST) SCE2012-27
Abstract (in Japanese) (See Japanese page) 
(in English) A new implementation of quantum voltage noise source (QVNS), integrated QVNS (IQVNS), for Johnson noise thermometry (JNT) is proposed. The concept is integration of all the QVNS subsystems on a superconducting integrated circuit chip, eliminating degradation of output voltage accuracy caused by crosstalk. On-chip, real-time pseudo-noise generation with IQVNS omits expensive microwave electronics and costly code calculations. We have designed an IQVNS chip consisting of rapid single flux quantum circuitry. Simulation shows that pseudo-white noise voltages generated by IQVNS are suitable for JNT measurements. A promising application of the JNT with IQVNS is re-evaluation of the temperature fixed points after the redefinition of Boltzmann’s constant.
Keyword (in Japanese) (See Japanese page) 
(in English) Noise Thermometry / Thermal Metrology / Temperature Standard / Noise Standard / Josephson Junction / Superconducting Integrated Circuit / /  
Reference Info. IEICE Tech. Rep., vol. 112, no. 408, SCE2012-27, pp. 13-18, Jan. 2013.
Paper # SCE2012-27 
Date of Issue 2013-01-17 (SCE) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SCE2012-27

Conference Information
Committee SCE  
Conference Date 2013-01-24 - 2013-01-24 
Place (in Japanese) (See Japanese page) 
Place (in English) Okayama Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Superconducting sensing technologies and their applications, etc. 
Paper Information
Registration To SCE 
Conference Code 2013-01-SCE 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Integrated quantum voltage noise source for Johnson noise thermometry 
Sub Title (in English)  
Keyword(1) Noise Thermometry  
Keyword(2) Thermal Metrology  
Keyword(3) Temperature Standard  
Keyword(4) Noise Standard  
Keyword(5) Josephson Junction  
Keyword(6) Superconducting Integrated Circuit  
Keyword(7)  
Keyword(8)  
1st Author's Name Masaaki Maezawa  
1st Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
2nd Author's Name Takahiro Yamada  
2nd Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
3rd Author's Name Chiharu Urano  
3rd Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2013-01-24 09:50:00 
Presentation Time 25 minutes 
Registration for SCE 
Paper # SCE2012-27 
Volume (vol) vol.112 
Number (no) no.408 
Page pp.13-18 
#Pages 6 
Date of Issue 2013-01-17 (SCE) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan