Paper Abstract and Keywords |
Presentation |
2013-02-27 14:10
Variation of Seebeck coefficient of Si-on-insulator layer induced by bias-injected carriers Hiroya Ikeda, Yuhei Suzuki, Kazutoshi Miwa (Shizuoka Univ.), Faiz Salleh (Shizuoka Univ./Research Fellow of JSPS) ED2012-129 SDM2012-158 Link to ES Tech. Rep. Archives: ED2012-129 SDM2012-158 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
The enhancement of Seebeck coefficient by controlling the Si Fermi energy is one of key issues for enhancing the thermoelectric performance by Si nanostructures. For this purpose, the variation of Seebeck coefficient in ultrathin Si-on-insulator (SOI) layer by external bias was experimentally and theoretically investigated. It was found that the SOI Seebeck coefficient is mainly tuned by the carrier concentration or Fermi energy near the buried-oxide layer and includes the influence of phonon drag. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
thermopile IR photodetector / Seebeck coefficient / ultrathin SOI layer / Fermi energy / phonon drag / / / |
Reference Info. |
IEICE Tech. Rep., vol. 112, no. 446, SDM2012-158, pp. 7-11, Feb. 2013. |
Paper # |
SDM2012-158 |
Date of Issue |
2013-02-20 (ED, SDM) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
ED2012-129 SDM2012-158 Link to ES Tech. Rep. Archives: ED2012-129 SDM2012-158 |
Conference Information |
Committee |
SDM ED |
Conference Date |
2013-02-27 - 2013-02-28 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Hokkaido Univ. |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Functional nanodevices and related technologies |
Paper Information |
Registration To |
SDM |
Conference Code |
2013-02-SDM-ED |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Variation of Seebeck coefficient of Si-on-insulator layer induced by bias-injected carriers |
Sub Title (in English) |
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Keyword(1) |
thermopile IR photodetector |
Keyword(2) |
Seebeck coefficient |
Keyword(3) |
ultrathin SOI layer |
Keyword(4) |
Fermi energy |
Keyword(5) |
phonon drag |
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1st Author's Name |
Hiroya Ikeda |
1st Author's Affiliation |
Shizuoka University (Shizuoka Univ.) |
2nd Author's Name |
Yuhei Suzuki |
2nd Author's Affiliation |
Shizuoka University (Shizuoka Univ.) |
3rd Author's Name |
Kazutoshi Miwa |
3rd Author's Affiliation |
Shizuoka University (Shizuoka Univ.) |
4th Author's Name |
Faiz Salleh |
4th Author's Affiliation |
Shizuoka University/Research Fellow of the Japan Society for the Promotion of Science (Shizuoka Univ./Research Fellow of JSPS) |
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Speaker |
Author-1 |
Date Time |
2013-02-27 14:10:00 |
Presentation Time |
25 minutes |
Registration for |
SDM |
Paper # |
ED2012-129, SDM2012-158 |
Volume (vol) |
vol.112 |
Number (no) |
no.445(ED), no.446(SDM) |
Page |
pp.7-11 |
#Pages |
5 |
Date of Issue |
2013-02-20 (ED, SDM) |
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