Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2013-03-05 13:30
Affect effects on the detection of deception
Heejung Park (Osaka Univ.), Ikuo Daibo (Tokyo Future Univ.) HCS2012-105
Abstract (in Japanese) (See Japanese page) 
(in English) The present study examined the influence of affect with the judgmental context on detecting deception. We predicted higher accuracy of truths and lies under feeling sad. After inducting affect that involved recalling life experiences, participants viewed deceptive or truthful films. Judgments of the targets’ guilt and their truthfulness were collected. As predicted, sad individuals achieved higher accuracy rates in classifying both truthful and deceptive films than happy individuals. Moreover, sad individuals rendered less the confidence on judgments of truths and lies than happy individuals. The implication of these findings was discussed.
Keyword (in Japanese) (See Japanese page) 
(in English) detecting deception / affect / information processing strategies / / / / /  
Reference Info. IEICE Tech. Rep., vol. 112, no. 455, HCS2012-105, pp. 155-160, March 2013.
Paper # HCS2012-105 
Date of Issue 2013-02-25 (HCS) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF HCS2012-105

Conference Information
Committee HCS  
Conference Date 2013-03-04 - 2013-03-05 
Place (in Japanese) (See Japanese page) 
Place (in English) Hetel Wellseason Hamanako 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design of the place, etc. 
Paper Information
Registration To HCS 
Conference Code 2013-03-HCS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Affect effects on the detection of deception 
Sub Title (in English)  
Keyword(1) detecting deception  
Keyword(2) affect  
Keyword(3) information processing strategies  
Keyword(4)  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Heejung Park  
1st Author's Affiliation Osaka University (Osaka Univ.)
2nd Author's Name Ikuo Daibo  
2nd Author's Affiliation Tokyo Future University (Tokyo Future Univ.)
3rd Author's Name  
3rd Author's Affiliation ()
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2013-03-05 13:30:00 
Presentation Time 30 minutes 
Registration for HCS 
Paper # HCS2012-105 
Volume (vol) vol.112 
Number (no) no.455 
Page pp.155-160 
#Pages 6 
Date of Issue 2013-02-25 (HCS) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan