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| Presentation | 2013-03-06 15:35 Robust Redundant Circuit Structure to Mitigate Wearout by Reversing Register Values Shogo Okada, Masaki Masuda (Kyoto Inst. of Tech.), Jun Yao, Hajime Shimada (NAIST), Kazutoshi Kobayashi (Kyoto Inst. of Tech.)  VLD2012-162 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | (Not available yet) | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | / / / / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 112, no. 451, VLD2012-162, pp. 147-152, March 2013. | |
| Paper # | VLD2012-162 | |
| Date of Issue | 2013-02-25 (VLD) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | VLD2012-162 |
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| Conference Information | |
| Committee | VLD |
| Conference Date | 2013-03-04 - 2013-03-06 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Okinawa Seinen Kaikan |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Design Technology for System-on-Silicon |
| Paper Information | |
| Registration To | VLD |
| Conference Code | 2013-03-VLD |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Robust Redundant Circuit Structure to Mitigate Wearout by Reversing Register Values |
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| 1st Author's Name | Shogo Okada |
| 1st Author's Affiliation | Kyoto Institute of Technology (Kyoto Inst. of Tech.) |
| 2nd Author's Name | Masaki Masuda |
| 2nd Author's Affiliation | Kyoto Institute of Technology (Kyoto Inst. of Tech.) |
| 3rd Author's Name | Jun Yao |
| 3rd Author's Affiliation | Nara Institute of Science and Technology (NAIST) |
| 4th Author's Name | Hajime Shimada |
| 4th Author's Affiliation | Nara Institute of Science and Technology (NAIST) |
| 5th Author's Name | Kazutoshi Kobayashi |
| 5th Author's Affiliation | Kyoto Institute of Technology (Kyoto Inst. of Tech.) |
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| Speaker | Author-1 |
| Date Time | 2013-03-06 15:35:00 |
| Presentation Time | 25 minutes |
| Registration for | VLD |
| Paper # | VLD2012-162 |
| Volume (vol) | vol.112 |
| Number (no) | no.451 |
| Page | pp.147-152 |
| #Pages | 6 |
| Date of Issue | 2013-02-25 (VLD) |
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