Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2013-03-06 15:10
Trojan Circuit for Fault Analysis Countermeasure and its Implementation
Takaya Tsukadaira, Daisuke Matsushima (Meijo Univ.), Takeshi Kumaki (Ritsumeikan Univ.), Masaya Yoshikawa (Meijo Univ.) VLD2012-161
Abstract (in Japanese) (See Japanese page) 
(in English) Recently, the threat of hardware Trojans in forged integrated circuits has become serious problem due to the advancement of reverse-engineering technologies. The hardware Trojan is a malicious hardware virus that is incorporated into the LSI circuit. When the hardware Trojan trigger is actuated, the LSI performs subversive operations, such as the leaking of important information. Almost all previous studies on a hardware Trojan focus on cryptographic circuits, because confidential information is generally protected using a cryptographic circuit. These previous studies adopted non-countermeasure circuits, although countermeasure circuits against illegal attacks are often used as cryptographic circuits in general. Therefore, this study proposes a new hardware Trojan for countermeasure circuits. Experimental results using FPGA show the threat of the proposed hardware Trojan.
Keyword (in Japanese) (See Japanese page) 
(in English) Fault Analysis / AES / Countermeasure Circuit / Hardware Trojan / / / /  
Reference Info. IEICE Tech. Rep., vol. 112, no. 451, VLD2012-161, pp. 141-146, March 2013.
Paper # VLD2012-161 
Date of Issue 2013-02-25 (VLD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF VLD2012-161

Conference Information
Committee VLD  
Conference Date 2013-03-04 - 2013-03-06 
Place (in Japanese) (See Japanese page) 
Place (in English) Okinawa Seinen Kaikan 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design Technology for System-on-Silicon 
Paper Information
Registration To VLD 
Conference Code 2013-03-VLD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Trojan Circuit for Fault Analysis Countermeasure and its Implementation 
Sub Title (in English)  
Keyword(1) Fault Analysis  
Keyword(2) AES  
Keyword(3) Countermeasure Circuit  
Keyword(4) Hardware Trojan  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Takaya Tsukadaira  
1st Author's Affiliation Meijo University (Meijo Univ.)
2nd Author's Name Daisuke Matsushima  
2nd Author's Affiliation Meijo University (Meijo Univ.)
3rd Author's Name Takeshi Kumaki  
3rd Author's Affiliation Ritsumeikan University (Ritsumeikan Univ.)
4th Author's Name Masaya Yoshikawa  
4th Author's Affiliation Meijo University (Meijo Univ.)
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2013-03-06 15:10:00 
Presentation Time 25 minutes 
Registration for VLD 
Paper # VLD2012-161 
Volume (vol) vol.112 
Number (no) no.451 
Page pp.141-146 
#Pages 6 
Date of Issue 2013-02-25 (VLD) 


[Return to Top Page]

[Return to IEICE Web Page]

(Line Height for English Pages: 1)

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan