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Paper Abstract and Keywords
Presentation 2013-03-14 15:05
Self-Checking Carry Look-ahead Adder by Carry-bit Duplication
Akihiro Mitoma (Kyoto Univ.), Nobutaka Kito (Chukyo Univ.), Naofumi Takagi (Kyoto Univ.) CPSY2012-98 DC2012-104
Abstract (in Japanese) (See Japanese page) 
(in English) We propose a self-checking carry look-ahead adder, which can detect errors caused by a single stuck-at fault in the adder. Because of duplicating each carry-bit and comparing only half of them, the area of the proposed adder is smaller than that of an existing self-checking carry look-ahead adder by sum-bit duplication. The inputs of the proposed adder are two operands and their parities, and the outputs are sum of operands, the predicted parity of the sum, two output lines of the input parities checker, and two output lines of the checker. As a result of an experiment, the area overhead of the proposed adder was smaller than that of the existing self-checking adder up to 31\%.
Keyword (in Japanese) (See Japanese page) 
(in English) self-checking / single stuck-at fault / carry look-ahead adder / adder / / / /  
Reference Info. IEICE Tech. Rep., vol. 112, no. 482, DC2012-104, pp. 277-282, March 2013.
Paper # DC2012-104 
Date of Issue 2013-03-06 (CPSY, DC) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF CPSY2012-98 DC2012-104

Conference Information
Committee CPSY DC IPSJ-SLDM IPSJ-EMB  
Conference Date 2013-03-13 - 2013-03-14 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To DC 
Conference Code 2013-03-CPSY-DC-SLDM-EMB 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Self-Checking Carry Look-ahead Adder by Carry-bit Duplication 
Sub Title (in English)  
Keyword(1) self-checking  
Keyword(2) single stuck-at fault  
Keyword(3) carry look-ahead adder  
Keyword(4) adder  
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1st Author's Name Akihiro Mitoma  
1st Author's Affiliation Kyoto University (Kyoto Univ.)
2nd Author's Name Nobutaka Kito  
2nd Author's Affiliation Chukyo University (Chukyo Univ.)
3rd Author's Name Naofumi Takagi  
3rd Author's Affiliation Kyoto University (Kyoto Univ.)
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Speaker Author-1 
Date Time 2013-03-14 15:05:00 
Presentation Time 25 minutes 
Registration for DC 
Paper # CPSY2012-98, DC2012-104 
Volume (vol) vol.112 
Number (no) no.481(CPSY), no.482(DC) 
Page pp.277-282 
#Pages 6 
Date of Issue 2013-03-06 (CPSY, DC) 

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