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Paper Abstract and Keywords
Presentation 2013-04-12 12:00
[Invited Lecture] An Integrated Variable Positive/Negative Temperature Coefficient Read Reference Generator for MLC PCM/NAND Hybrid 3D SSD
Kousuke Miyaji, Koh Johguchi (Chuo Univ.), Kazuhide Higuchi (Univ. of Tokyo), Ken Takeuchi (Chuo Univ.) ICD2013-17
Abstract (in Japanese) (See Japanese page) 
(in English) An integrated variable temperature coefficient (TC) reference generator for multi-level cell phase change memory (PCM)/NAND flash memory hybrid three dimensional solid-state drive is proposed and demonstrated by 0.18um CMOS process. The proposed generator outputs both positive and negative TC reference current and voltage for PCM and NAND, respectively. TC is programmable and it can be widely changed down to -5.47mV/K and up to 5.74mV/K. Output level is also variable and it is independently controlled from the TC control. The flexible TC and output level control also enable a compensation of characteristics changes due to the program/erase cycling as wells as the process variations of the memory devices. The size of the reference generator is 0.195mm2. The power consumption is 0.68mW at 120degC, 2.3V output.
Keyword (in Japanese) (See Japanese page) 
(in English) phase change memory / NAND flash memory / solid-state drive / reference circuit / / / /  
Reference Info. IEICE Tech. Rep., vol. 113, no. 1, ICD2013-17, pp. 85-90, April 2013.
Paper # ICD2013-17 
Date of Issue 2013-04-04 (ICD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee ICD  
Conference Date 2013-04-11 - 2013-04-12 
Place (in Japanese) (See Japanese page) 
Place (in English) Advanced Industrial Science and Technology (AIST) 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Memory Device Technologies 
Paper Information
Registration To ICD 
Conference Code 2013-04-ICD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) An Integrated Variable Positive/Negative Temperature Coefficient Read Reference Generator for MLC PCM/NAND Hybrid 3D SSD 
Sub Title (in English)  
Keyword(1) phase change memory  
Keyword(2) NAND flash memory  
Keyword(3) solid-state drive  
Keyword(4) reference circuit  
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1st Author's Name Kousuke Miyaji  
1st Author's Affiliation Chuo University (Chuo Univ.)
2nd Author's Name Koh Johguchi  
2nd Author's Affiliation Chuo University (Chuo Univ.)
3rd Author's Name Kazuhide Higuchi  
3rd Author's Affiliation University of Tokyo (Univ. of Tokyo)
4th Author's Name Ken Takeuchi  
4th Author's Affiliation Chuo University (Chuo Univ.)
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Speaker Author-1 
Date Time 2013-04-12 12:00:00 
Presentation Time 25 minutes 
Registration for ICD 
Paper # ICD2013-17 
Volume (vol) vol.113 
Number (no) no.1 
Page pp.85-90 
#Pages 6 
Date of Issue 2013-04-04 (ICD) 

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