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Paper Abstract and Keywords
Presentation 2013-04-25 13:45
Extremely sensitive fluorescence measurements by evanescent excitation and applications
Toshihiko Nagamura (Kitakyushu Nat'l Coll. Technol.) SDM2013-4 OME2013-4
Abstract (in Japanese) (See Japanese page) 
(in English) Highly sensitive fluorescence measurement by electric field-enhanced evanescent waves and its applications to the followings are presented; spatially-resolved evaluation of molecular motions of polymer thin films at/near the solid interface, bio- and chemical sensing, nitrogen oxides gas sensing with surface plasmon resonance conditions, and ethanol sensing in gas/solution by guided wave mode.
Keyword (in Japanese) (See Japanese page) 
(in English) evanescent wave / fluorescence measurements / electric field enhancement / surface plasmon resonance / guided wave mode / molecular motion at/near the solid interface / spatially resolved measurements / high performance gas sensors  
Reference Info. IEICE Tech. Rep., vol. 113, no. 18, OME2013-4, pp. 15-16, April 2013.
Paper # OME2013-4 
Date of Issue 2013-04-18 (SDM, OME) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SDM2013-4 OME2013-4

Conference Information
Committee OME SDM  
Conference Date 2013-04-25 - 2013-04-26 
Place (in Japanese) (See Japanese page) 
Place (in English) Yakusima Environmental Culture Village Center 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Advanced Thin-Film Devices (Si, Compound, Organic), biotechnology, Materials, Measurement Technique and Related Topics 
Paper Information
Registration To OME 
Conference Code 2013-04-OME-SDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Extremely sensitive fluorescence measurements by evanescent excitation and applications 
Sub Title (in English)  
Keyword(1) evanescent wave  
Keyword(2) fluorescence measurements  
Keyword(3) electric field enhancement  
Keyword(4) surface plasmon resonance  
Keyword(5) guided wave mode  
Keyword(6) molecular motion at/near the solid interface  
Keyword(7) spatially resolved measurements  
Keyword(8) high performance gas sensors  
1st Author's Name Toshihiko Nagamura  
1st Author's Affiliation Kitakyushu National College of Technology (Kitakyushu Nat'l Coll. Technol.)
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Speaker Author-1 
Date Time 2013-04-25 13:45:00 
Presentation Time 25 minutes 
Registration for OME 
Paper # SDM2013-4, OME2013-4 
Volume (vol) vol.113 
Number (no) no.17(SDM), no.18(OME) 
Page pp.15-16 
#Pages 2 
Date of Issue 2013-04-18 (SDM, OME) 

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