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Paper Abstract and Keywords
Presentation 2013-05-10 11:45
An investigation of relationship between lines of comments and fault-proneness in small-sized programs
Hirohisa Aman (Ehime Univ.) SS2013-12
Abstract (in Japanese) (See Japanese page) 
(in English) While comments are useful in enhancing the program readability, some comments would be used for
covering up complicated code fragments. Thus, code fragments with comments would be suspected to have potential
faults. This paper focuses on small-sized programs, which do not need many comments because of their smallness,
and surveyed 20 major open source software to analyze the relationship between the lines of comments and the
fault-proneness. The survey results shows that small-sized programs, which have comments in their methods, tend
to have about two times higher risk of potential faults than non-commented ones.
Keyword (in Japanese) (See Japanese page) 
(in English) comments / fault-proneness / metrics / small-sized program / / / /  
Reference Info. IEICE Tech. Rep., vol. 113, no. 24, SS2013-12, pp. 67-72, May 2013.
Paper # SS2013-12 
Date of Issue 2013-05-02 (SS) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SS2013-12

Conference Information
Committee SS  
Conference Date 2013-05-09 - 2013-05-10 
Place (in Japanese) (See Japanese page) 
Place (in English) Kagawa University (Saiwaimachi) 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Software Science, Software Engineering, etc. 
Paper Information
Registration To SS 
Conference Code 2013-05-SS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) An investigation of relationship between lines of comments and fault-proneness in small-sized programs 
Sub Title (in English)  
Keyword(1) comments  
Keyword(2) fault-proneness  
Keyword(3) metrics  
Keyword(4) small-sized program  
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1st Author's Name Hirohisa Aman  
1st Author's Affiliation Ehime University (Ehime Univ.)
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Speaker Author-1 
Date Time 2013-05-10 11:45:00 
Presentation Time 30 minutes 
Registration for SS 
Paper # SS2013-12 
Volume (vol) vol.113 
Number (no) no.24 
Page pp.67-72 
#Pages
Date of Issue 2013-05-02 (SS) 


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