Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2013-05-10 11:15
Influence of Organizational Change on Product Metrics and Defects
Seiji Sato, Hironori Washizaki, Yoshiaki Fukazawa (Waseda Univ.), Sakae Inoue, Hiroyuki Ono, Yoshiiku Hanai, Mikihiko Yamamoto (Fujitsu) SS2013-11
Abstract (in Japanese) (See Japanese page) 
(in English) In software development, the development organization sometimes changes, but its influence on software quality has not yet been elucidated. In this paper, we introduce textit{origins} --- the creation and modification history of files --- to study the effects of organizational change on software quality. Using origins, we analyze two open source projects developed by a total of three organizations. We conduct statistical analysis to investigate the relationship between origins, product metrics, and defects. As a result, we find that files modified by multiple organizations or by later organizations tend to be complex and faulty, and that complex files tend to be faulty regardless of origin. Additionally, we construct a fault prediction model that uses both origins and product metrics as the predictors, and improve the model that uses only product metrics.
Keyword (in Japanese) (See Japanese page) 
(in English) Organizational change / Product metrics / Defects / / / / /  
Reference Info. IEICE Tech. Rep., vol. 113, no. 24, SS2013-11, pp. 61-66, May 2013.
Paper # SS2013-11 
Date of Issue 2013-05-02 (SS) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SS2013-11

Conference Information
Committee SS  
Conference Date 2013-05-09 - 2013-05-10 
Place (in Japanese) (See Japanese page) 
Place (in English) Kagawa University (Saiwaimachi) 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Software Science, Software Engineering, etc. 
Paper Information
Registration To SS 
Conference Code 2013-05-SS 
Language English 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Influence of Organizational Change on Product Metrics and Defects 
Sub Title (in English)  
Keyword(1) Organizational change  
Keyword(2) Product metrics  
Keyword(3) Defects  
Keyword(4)  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Seiji Sato  
1st Author's Affiliation Waseda University (Waseda Univ.)
2nd Author's Name Hironori Washizaki  
2nd Author's Affiliation Waseda University (Waseda Univ.)
3rd Author's Name Yoshiaki Fukazawa  
3rd Author's Affiliation Waseda University (Waseda Univ.)
4th Author's Name Sakae Inoue  
4th Author's Affiliation Fujitsu Limited (Fujitsu)
5th Author's Name Hiroyuki Ono  
5th Author's Affiliation Fujitsu Limited (Fujitsu)
6th Author's Name Yoshiiku Hanai  
6th Author's Affiliation Fujitsu Limited (Fujitsu)
7th Author's Name Mikihiko Yamamoto  
7th Author's Affiliation Fujitsu Limited (Fujitsu)
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2013-05-10 11:15:00 
Presentation Time 30 minutes 
Registration for SS 
Paper # SS2013-11 
Volume (vol) vol.113 
Number (no) no.24 
Page pp.61-66 
#Pages 6 
Date of Issue 2013-05-02 (SS) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan