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Paper Abstract and Keywords
Presentation 2013-05-16 16:10
The dissolution process of Si into Ge melt and SiGe growth mechanism by X-ray penetration method
Muthusamy Omprakash, Mukannan Arivanandhan, Raman Aun Kumar, Hiroshi Morii, Toru Aoki, Tadanobu Koyama, Yoshimi Momose, Hiroshi Ikeda, Hirokazu Tatsuoka (Shizuoka Univ.), Yasunori Okano (Osaka Univ.), Tetsuo Ozawa (Shizuoka Inst. of Science and Tech.), Yuko Inatomi (JAXA), Sridharan Moorth Babu (Anna Univ.), Yasuhiro Hayakawa (Shizuoka Univ.) ED2013-21 CPM2013-6 SDM2013-28
Abstract (in Japanese) (See Japanese page) 
(in English) (Not available yet)
Keyword (in Japanese) (See Japanese page) 
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Reference Info. IEICE Tech. Rep., vol. 113, no. 41, SDM2013-28, pp. 27-31, May 2013.
Paper # SDM2013-28 
Date of Issue 2013-05-09 (ED, CPM, SDM) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ED2013-21 CPM2013-6 SDM2013-28

Conference Information
Committee SDM ED CPM  
Conference Date 2013-05-16 - 2013-05-17 
Place (in Japanese) (See Japanese page) 
Place (in English) Shizuoka Univ. (Hamamatsu) Graduate School of Sci. and Technol. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Crystal Growth, Characterization, Device, etc (compound semiconductors, Si, SiGe, optical and electronic materials) 
Paper Information
Registration To SDM 
Conference Code 2013-05-SDM-ED-CPM 
Language English 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) The dissolution process of Si into Ge melt and SiGe growth mechanism by X-ray penetration method 
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1st Author's Name Muthusamy Omprakash  
1st Author's Affiliation Shizuoka University (Shizuoka Univ.)
2nd Author's Name Mukannan Arivanandhan  
2nd Author's Affiliation Shizuoka Universit (Shizuoka Univ.)
3rd Author's Name Raman Aun Kumar  
3rd Author's Affiliation Shizuoka Universit (Shizuoka Univ.)
4th Author's Name Hiroshi Morii  
4th Author's Affiliation Shizuoka Universit (Shizuoka Univ.)
5th Author's Name Toru Aoki  
5th Author's Affiliation Shizuoka Universit (Shizuoka Univ.)
6th Author's Name Tadanobu Koyama  
6th Author's Affiliation Shizuoka Universit (Shizuoka Univ.)
7th Author's Name Yoshimi Momose  
7th Author's Affiliation Shizuoka Universit (Shizuoka Univ.)
8th Author's Name Hiroshi Ikeda  
8th Author's Affiliation Shizuoka Universit (Shizuoka Univ.)
9th Author's Name Hirokazu Tatsuoka  
9th Author's Affiliation Shizuoka Universit (Shizuoka Univ.)
10th Author's Name Yasunori Okano  
10th Author's Affiliation Osaka Universit (Osaka Univ.)
11th Author's Name Tetsuo Ozawa  
11th Author's Affiliation Shizuoka Institute of Science and Technology (Shizuoka Inst. of Science and Tech.)
12th Author's Name Yuko Inatomi  
12th Author's Affiliation JAXA (JAXA)
13th Author's Name Sridharan Moorth Babu  
13th Author's Affiliation Anna University (Anna Univ.)
14th Author's Name Yasuhiro Hayakawa  
14th Author's Affiliation Shizuoka University (Shizuoka Univ.)
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Speaker Author-1 
Date Time 2013-05-16 16:10:00 
Presentation Time 25 minutes 
Registration for SDM 
Paper # ED2013-21, CPM2013-6, SDM2013-28 
Volume (vol) vol.113 
Number (no) no.39(ED), no.40(CPM), no.41(SDM) 
Page pp.27-31 
#Pages 5 
Date of Issue 2013-05-09 (ED, CPM, SDM) 

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