| Paper Abstract and Keywords |
| Presentation |
2013-05-17 15:55
Observation of damage shapes caused by break arcs on Ag and AgSnO2 contact surfaces during switching operations Makoto Hasegawa, Keisuke Takahashi, Daichi Kawamura, Yuya Hirano (Chitose Inst. of Science and Tech.) EMD2013-6 |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
An evaluation system enabling observation and evaluation of changes on contact surface conditions (growth of a crater and/or a pip) during switching operations has been being constructed. Up to now, evaluation of a movable cathode surface profile by way of an optical cross-section method, as well as observation of the counterpart stationary anode surface by means of a CCD camera, has been realized. For the cathode surfaces, temporal changes in cross-sectional profiles along a particular line over a crater formed on the cathode surface were observed. In this paper, more visual observation of temporal changes in the cathode surface conditions (a crater growth process) during switching operations were tried by drawing three-dimensional images of the movable cathode samples based on data obtained with the optical cross-section method. More specifically, Ag contact pairs and AgSnO2 contact pairs were operated to break a DC14V-2A or 3A load current in a DC inductive circuit, and changes in the contact surfaces during the switching operations were observed and evaluated. |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
optical cross-section method / electrical contacts / arc discharge / material transfer / erosion / Ag contacts / AgSnO2 contacts / |
| Reference Info. |
IEICE Tech. Rep., vol. 113, no. 48, EMD2013-6, pp. 29-34, May 2013. |
| Paper # |
EMD2013-6 |
| Date of Issue |
2013-05-10 (EMD) |
| ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
| Download PDF |
EMD2013-6 |
| Conference Information |
| Committee |
EMD |
| Conference Date |
2013-05-17 - 2013-05-17 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
Chitose Arcadia Plaza |
| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
|
| Paper Information |
| Registration To |
EMD |
| Conference Code |
2013-05-EMD |
| Language |
Japanese |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
Observation of damage shapes caused by break arcs on Ag and AgSnO2 contact surfaces during switching operations |
| Sub Title (in English) |
|
| Keyword(1) |
optical cross-section method |
| Keyword(2) |
electrical contacts |
| Keyword(3) |
arc discharge |
| Keyword(4) |
material transfer |
| Keyword(5) |
erosion |
| Keyword(6) |
Ag contacts |
| Keyword(7) |
AgSnO2 contacts |
| Keyword(8) |
|
| 1st Author's Name |
Makoto Hasegawa |
| 1st Author's Affiliation |
Chitose Institute of Science and Technology (Chitose Inst. of Science and Tech.) |
| 2nd Author's Name |
Keisuke Takahashi |
| 2nd Author's Affiliation |
Chitose Institute of Science and Technology (Chitose Inst. of Science and Tech.) |
| 3rd Author's Name |
Daichi Kawamura |
| 3rd Author's Affiliation |
Chitose Institute of Science and Technology (Chitose Inst. of Science and Tech.) |
| 4th Author's Name |
Yuya Hirano |
| 4th Author's Affiliation |
Chitose Institute of Science and Technology (Chitose Inst. of Science and Tech.) |
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| Speaker |
Author-1 |
| Date Time |
2013-05-17 15:55:00 |
| Presentation Time |
25 minutes |
| Registration for |
EMD |
| Paper # |
EMD2013-6 |
| Volume (vol) |
vol.113 |
| Number (no) |
no.48 |
| Page |
pp.29-34 |
| #Pages |
6 |
| Date of Issue |
2013-05-10 (EMD) |