Paper Abstract and Keywords |
Presentation |
2013-08-01 09:50
Scaling Strategy for Low Power RF Applications with Multi Gate Oxide Dual Work function (DWF) MOSFETs Utilizing Self-Aligned Integration Scheme Toshitaka Miyata, Shigeru Kawanaka, Akira Hokazono, Tatsuya Ohguro, Yoshiaki Toyoshima (TOSHIBA) SDM2013-67 ICD2013-49 Link to ES Tech. Rep. Archives: SDM2013-67 ICD2013-49 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Dual Work Function (DWF)-MOSFET of 100 nm gate length device with self-aligned integration scheme was demonstrated utilizing conventional CMOS platform process for the first time. Here, we obtained not only the improved transconductance (GM) and drain conductance (GD), but also the enlarged operation voltage window employing multi gate oxide structure combined with DWF-MOSFET gate stack. Also, the discriminative features of DWF-MOSFET operation were revealed by TCAD analysis indicating the potential ability of reduced power consumption for RF applications. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
RF transistor / Dual Work Function FET / DWF-FET / Multi Gate Oxide Dual Work Function / MGO-DWF-FET / / / |
Reference Info. |
IEICE Tech. Rep., vol. 113, no. 172, SDM2013-67, pp. 13-18, Aug. 2013. |
Paper # |
SDM2013-67 |
Date of Issue |
2013-07-25 (SDM, ICD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
SDM2013-67 ICD2013-49 Link to ES Tech. Rep. Archives: SDM2013-67 ICD2013-49 |
Conference Information |
Committee |
SDM ICD |
Conference Date |
2013-08-01 - 2013-08-02 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kanazawa University |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Low voltage/low power techniques, novel devices, circuits, and applications |
Paper Information |
Registration To |
SDM |
Conference Code |
2013-08-SDM-ICD |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Scaling Strategy for Low Power RF Applications with Multi Gate Oxide Dual Work function (DWF) MOSFETs Utilizing Self-Aligned Integration Scheme |
Sub Title (in English) |
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Keyword(1) |
RF transistor |
Keyword(2) |
Dual Work Function FET |
Keyword(3) |
DWF-FET |
Keyword(4) |
Multi Gate Oxide Dual Work Function |
Keyword(5) |
MGO-DWF-FET |
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1st Author's Name |
Toshitaka Miyata |
1st Author's Affiliation |
TOSHIBA (TOSHIBA) |
2nd Author's Name |
Shigeru Kawanaka |
2nd Author's Affiliation |
TOSHIBA (TOSHIBA) |
3rd Author's Name |
Akira Hokazono |
3rd Author's Affiliation |
TOSHIBA (TOSHIBA) |
4th Author's Name |
Tatsuya Ohguro |
4th Author's Affiliation |
TOSHIBA (TOSHIBA) |
5th Author's Name |
Yoshiaki Toyoshima |
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TOSHIBA (TOSHIBA) |
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Speaker |
Author-1 |
Date Time |
2013-08-01 09:50:00 |
Presentation Time |
25 minutes |
Registration for |
SDM |
Paper # |
SDM2013-67, ICD2013-49 |
Volume (vol) |
vol.113 |
Number (no) |
no.172(SDM), no.173(ICD) |
Page |
pp.13-18 |
#Pages |
6 |
Date of Issue |
2013-07-25 (SDM, ICD) |
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