Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2013-09-12 13:25
Fundamental limit and its realization for injection-locking technique -- Applications --
Yoji Yabe, Shusaku Iikura, Kazuki Nakada, Tomoyuki Morikawa, Temuulen Enkhee, Ryohei Nagatome, Hisa-Aki Tanaka (UEC) MW2013-89
Abstract (in Japanese) (See Japanese page) 
(in English) Since injection-locking improves frequency stability in the oscillator, its researches have been steadily progressed for various applications. However, as far as we know, any design methodology for optimizing such injection-locking ability has not yet been established. In this study, using a recently developed optimization theory by our group it becomes possible to maximize locking ranges of two practically important oscillators; CMOS ring oscillators and Class-E oscillators for power electronics, under realistic constraints. This suggests a physical limit of injection-locking is realized in a practical environment by our design method.
Keyword (in Japanese) (See Japanese page) 
(in English) Injection locking / Phase reduction method / Impulse sensitivity function / CMOS ring oscillator / Class-E oscillator / / /  
Reference Info. IEICE Tech. Rep., vol. 113, no. 204, MW2013-89, pp. 5-10, Sept. 2013.
Paper # MW2013-89 
Date of Issue 2013-09-05 (MW) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF MW2013-89

Conference Information
Committee MW AP  
Conference Date 2013-09-12 - 2013-09-13 
Place (in Japanese) (See Japanese page) 
Place (in English) NHK Science Tech. Research Lab. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Microwave, mm-wave, and others 
Paper Information
Registration To MW 
Conference Code 2013-09-MW-AP 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Fundamental limit and its realization for injection-locking technique 
Sub Title (in English) Applications 
Keyword(1) Injection locking  
Keyword(2) Phase reduction method  
Keyword(3) Impulse sensitivity function  
Keyword(4) CMOS ring oscillator  
Keyword(5) Class-E oscillator  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Yoji Yabe  
1st Author's Affiliation University of Electro-Communications (UEC)
2nd Author's Name Shusaku Iikura  
2nd Author's Affiliation University of Electro-Communications (UEC)
3rd Author's Name Kazuki Nakada  
3rd Author's Affiliation University of Electro-Communications (UEC)
4th Author's Name Tomoyuki Morikawa  
4th Author's Affiliation University of Electro-Communications (UEC)
5th Author's Name Temuulen Enkhee  
5th Author's Affiliation University of Electro-Communications (UEC)
6th Author's Name Ryohei Nagatome  
6th Author's Affiliation University of Electro-Communications (UEC)
7th Author's Name Hisa-Aki Tanaka  
7th Author's Affiliation University of Electro-Communications (UEC)
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2013-09-12 13:25:00 
Presentation Time 25 minutes 
Registration for MW 
Paper # MW2013-89 
Volume (vol) vol.113 
Number (no) no.204 
Page pp.5-10 
#Pages 6 
Date of Issue 2013-09-05 (MW) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan