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Paper Abstract and Keywords
Presentation 2013-10-18 14:20
A Mathematical Deterioration Model for the Thermal Stress
Hideo Hirose, Takenori Sakumura (Kyushu Inst. of Tech.) R2013-66
Abstract (in Japanese) (See Japanese page) 
(in English) We try to construct mathematical models to represent the relationship between the thermal stress and the deterioration rate for electrical insulation. The Arrhenius-log-normal model has been used generally for such a deterioration model due to the thermal stress. The Arrhenius law is based on the chemical reaction theory between the absolute temperature and the activity of materials. On the other hand, as for the log-normal distribution, we have been only followed the traditional statistical treatment such that the deterioration could be represented by the normal distribution when logarithmic time is used. The Arrhenius-log-normal model is a combination of these two models.
However, in the International Electrotechnical Commission 60216-1, the deterioration due to the thermal stress is represented by using the mechanical strength, and the time showing 50% mechanical strength to the initial strength is defined as the failure time. We assume here the generalized Pareto distribution model, the generalized logistic distribution model, or log-normal distribution model for such a model.
Thus, in this paper, we construct new mathematical models combined by the Arrhenius law with the generalized Pareto distribution model, the generalized logistic distribution model, or the log-normal distribution model.
Keyword (in Japanese) (See Japanese page) 
(in English) thermal deterioration / Arrhenius law / generalized Pareto distribution / generalized logistic distribution / log-normal distribution / ordinary differential equation / growth curve / method of least squares  
Reference Info. IEICE Tech. Rep., vol. 113, no. 249, R2013-66, pp. 13-18, Oct. 2013.
Paper # R2013-66 
Date of Issue 2013-10-11 (R) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee R  
Conference Date 2013-10-18 - 2013-10-18 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To R 
Conference Code 2013-10-R 
Language English (Japanese title is available) 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Mathematical Deterioration Model for the Thermal Stress 
Sub Title (in English)  
Keyword(1) thermal deterioration  
Keyword(2) Arrhenius law  
Keyword(3) generalized Pareto distribution  
Keyword(4) generalized logistic distribution  
Keyword(5) log-normal distribution  
Keyword(6) ordinary differential equation  
Keyword(7) growth curve  
Keyword(8) method of least squares  
1st Author's Name Hideo Hirose  
1st Author's Affiliation Kyushu Institute of Technology (Kyushu Inst. of Tech.)
2nd Author's Name Takenori Sakumura  
2nd Author's Affiliation Kyushu Institute of Technology (Kyushu Inst. of Tech.)
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Speaker Author-1 
Date Time 2013-10-18 14:20:00 
Presentation Time 25 minutes 
Registration for R 
Paper # R2013-66 
Volume (vol) vol.113 
Number (no) no.249 
Page pp.13-18 
#Pages 6 
Date of Issue 2013-10-11 (R) 

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