Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2013-10-24 11:20
In-situ Measurement of Complex EM Parameters of High-loss Materials with Open-ended Coaxial Probe
Junya Oda, Chun-Ping Chen, Katsuhiro Kamata, Takemasa Kato, Tetsuo Anada (Kanagawa Univ.) EMCJ2013-65 MW2013-105 EST2013-57
Abstract (in Japanese) (See Japanese page) 
(in English) As a non-destructive measurement technique, flanged open-ended coaxial probes have been attracting a lot of interests in the simultaneous measurement of the complex permittivity and permeability of high loss materials. To extract two complex parameters, at least two complex reflection coefficients under different experimental setting are needed. This report proposes a new method, named “Two-Probe-Method”, to obtain two reflections using two coaxial probes with different dimensions. The broadband frequency-swept measurement/simulation has been conducted on a typical absorbing material using APC-7 and 3.5mm coaxial probes. The experimental results agree with the reference data, which validates the feasibility and effectiveness of this improved technique.
Keyword (in Japanese) (See Japanese page) 
(in English) Complex permeability / Complex permittivity / Open-ended coaxial probe / Nondestructive measurement / in-situ measurement / absorbing material / Two-Probe-Method /  
Reference Info. IEICE Tech. Rep., vol. 113, no. 261, EST2013-57, pp. 31-34, Oct. 2013.
Paper # EST2013-57 
Date of Issue 2013-10-17 (EMCJ, MW, EST) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMCJ2013-65 MW2013-105 EST2013-57

Conference Information
Committee EMCJ IEE-EMC MW EST  
Conference Date 2013-10-24 - 2013-10-25 
Place (in Japanese) (See Japanese page) 
Place (in English) Tohoku Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) EMC, Micro wave, Electromagnetic analysis, etc. 
Paper Information
Registration To EST 
Conference Code 2013-10-EMCJ-EMC-MW-EST 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) In-situ Measurement of Complex EM Parameters of High-loss Materials with Open-ended Coaxial Probe 
Sub Title (in English)  
Keyword(1) Complex permeability  
Keyword(2) Complex permittivity  
Keyword(3) Open-ended coaxial probe  
Keyword(4) Nondestructive measurement  
Keyword(5) in-situ measurement  
Keyword(6) absorbing material  
Keyword(7) Two-Probe-Method  
Keyword(8)  
1st Author's Name Junya Oda  
1st Author's Affiliation Kanagawa University (Kanagawa Univ.)
2nd Author's Name Chun-Ping Chen  
2nd Author's Affiliation Kanagawa University (Kanagawa Univ.)
3rd Author's Name Katsuhiro Kamata  
3rd Author's Affiliation Kanagawa University (Kanagawa Univ.)
4th Author's Name Takemasa Kato  
4th Author's Affiliation Kanagawa University (Kanagawa Univ.)
5th Author's Name Tetsuo Anada  
5th Author's Affiliation Kanagawa University (Kanagawa Univ.)
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2013-10-24 11:20:00 
Presentation Time 25 minutes 
Registration for EST 
Paper # EMCJ2013-65, MW2013-105, EST2013-57 
Volume (vol) vol.113 
Number (no) no.259(EMCJ), no.260(MW), no.261(EST) 
Page pp.31-34 
#Pages
Date of Issue 2013-10-17 (EMCJ, MW, EST) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan