Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2013-10-25 17:05
Fundamental Study on a Mechanism of Non-invasive Fault-injection at Arbitrary Timing of Cryptographic Processing
Mizuki Kobayashi, Yu-ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone (Tohoku Univ.) EMCJ2013-90 MW2013-130 EST2013-82
Abstract (in Japanese) (See Japanese page) 
(in English) In this paper, we introduce a new type of intentional electromagnetic interference (IEMI) fault-injection method with timing control based on leaked information. We demonstrate the fault injection attack based on the above IEMI through experiments using an Advanced Encryption Standard (AES) module implemented on a standard evaluation board (SASEBO). The experimental results indicate that generating effective faults is feasible. This paper also investigates a mechanism of faulty outputs from cryptographic modules due to the proposal method. We show the mechanism of fault occurrence through experiments using faulty ciphertexts and a sinusoidal wave injection to the specific round. The experimental results indicate that faulty outputs from cryptographic modules are caused by the overclocking to the cryptographic module.
Keyword (in Japanese) (See Japanese page) 
(in English) Intentional Electromagnetic Interference / Common-mode Current / Fault Analysis / Side-channel Analysis / / / /  
Reference Info. IEICE Tech. Rep., vol. 113, no. 259, EMCJ2013-90, pp. 175-179, Oct. 2013.
Paper # EMCJ2013-90 
Date of Issue 2013-10-17 (EMCJ, MW, EST) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMCJ2013-90 MW2013-130 EST2013-82

Conference Information
Committee EMCJ IEE-EMC MW EST  
Conference Date 2013-10-24 - 2013-10-25 
Place (in Japanese) (See Japanese page) 
Place (in English) Tohoku Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) EMC, Micro wave, Electromagnetic analysis, etc. 
Paper Information
Registration To EMCJ 
Conference Code 2013-10-EMCJ-EMC-MW-EST 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Fundamental Study on a Mechanism of Non-invasive Fault-injection at Arbitrary Timing of Cryptographic Processing 
Sub Title (in English)  
Keyword(1) Intentional Electromagnetic Interference  
Keyword(2) Common-mode Current  
Keyword(3) Fault Analysis  
Keyword(4) Side-channel Analysis  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Mizuki Kobayashi  
1st Author's Affiliation Tohoku University (Tohoku Univ.)
2nd Author's Name Yu-ichi Hayashi  
2nd Author's Affiliation Tohoku University (Tohoku Univ.)
3rd Author's Name Naofumi Homma  
3rd Author's Affiliation Tohoku University (Tohoku Univ.)
4th Author's Name Takaaki Mizuki  
4th Author's Affiliation Tohoku University (Tohoku Univ.)
5th Author's Name Takafumi Aoki  
5th Author's Affiliation Tohoku University (Tohoku Univ.)
6th Author's Name Hideaki Sone  
6th Author's Affiliation Tohoku University (Tohoku Univ.)
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2013-10-25 17:05:00 
Presentation Time 25 minutes 
Registration for EMCJ 
Paper # EMCJ2013-90, MW2013-130, EST2013-82 
Volume (vol) vol.113 
Number (no) no.259(EMCJ), no.260(MW), no.261(EST) 
Page pp.175-179 
#Pages 5 
Date of Issue 2013-10-17 (EMCJ, MW, EST) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan