Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2013-10-25 13:30
Efficient random test case generation for constrained interaction testing
Yasuhiro Hirasaki, Hideharu Kojima, Tatsuhiro Tsuchiya (Osaka Univ.) SS2013-45
Abstract (in Japanese) (See Japanese page) 
(in English) This paper discusses interaction testing using random testing.
Random testing can generate test cases very fast, but directly applying the method to constrained interaction testing results in insufficient interaction coverage.
To solve this problem, we have proposed a method that is tailored constrained interaction testing.
In this method, if a test case that was randomly generated violates the constraints,
then new test cases are systematically generated to compensate the loss in interaction coverage caused by omitting the constraint-violating test case.
In this paper, we evaluate the effectiveness of a key heuristic used in the method.
The results show that the heuristic significantly reduces the number of newly added test cases.
Keyword (in Japanese) (See Japanese page) 
(in English) random testing / combinatorial interaction testing / constraints / / / / /  
Reference Info. IEICE Tech. Rep., vol. 113, no. 269, SS2013-45, pp. 163-166, Oct. 2013.
Paper # SS2013-45 
Date of Issue 2013-10-17 (SS) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SS2013-45

Conference Information
Committee SS IPSJ-SE  
Conference Date 2013-10-24 - 2013-10-25 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To SS 
Conference Code 2013-10-SS-SE 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Efficient random test case generation for constrained interaction testing 
Sub Title (in English)  
Keyword(1) random testing  
Keyword(2) combinatorial interaction testing  
Keyword(3) constraints  
Keyword(4)  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Yasuhiro Hirasaki  
1st Author's Affiliation Osaka University (Osaka Univ.)
2nd Author's Name Hideharu Kojima  
2nd Author's Affiliation Osaka University (Osaka Univ.)
3rd Author's Name Tatsuhiro Tsuchiya  
3rd Author's Affiliation Osaka University (Osaka Univ.)
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2013-10-25 13:30:00 
Presentation Time 20 minutes 
Registration for SS 
Paper # SS2013-45 
Volume (vol) vol.113 
Number (no) no.269 
Page pp.163-166 
#Pages 4 
Date of Issue 2013-10-17 (SS) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan