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| Presentation | 2013-12-19 11:50 Experimental parameter extraction method for an equivalent multistage thermal RC ladder circuit used to a GaN HEMT large-signal model Shingo Yoshida, Ryo Ishikawa, Kazuhiko Honjo (UEC)  MW2013-156 Link to ES Tech. Rep. Archives: MW2013-156 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | We have been developing an analysis method for third-order intermodulation distortion caused by a thermal memory effect. An equivalent multistage thermal RC ladder circuit is used to emulate this effect precisely. Circuit parameters were estimated based on a three-dimensional thermal simulation, in a previous work. To omit this process, an experimental parameter estimation method has been proposed. The circuit parameters are estimated from a transient electrical step response measurement. This method was applied to a AlGaN / GaN HEMT element. The third-order intermodulation distortion for a fabricated GaN HEMT amplifier was evaluated. The measured results were well predicted in a simulation that an Angelov-GaN large signal model connecting the extracted multistage thermal RC ladder circuit was used. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | GaN HEMT / large signal model / power amplifier / RC ladder circuit / IMD3 / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 113, no. 365, MW2013-156, pp. 29-34, Dec. 2013. | |
| Paper # | MW2013-156 | |
| Date of Issue | 2013-12-12 (MW) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | MW2013-156 Link to ES Tech. Rep. Archives: MW2013-156 |
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| Conference Information | |
| Committee | MW |
| Conference Date | 2013-12-19 - 2013-12-20 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Saitama Univ. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Microwave Technologies / Student |
| Paper Information | |
| Registration To | MW |
| Conference Code | 2013-12-MW |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Experimental parameter extraction method for an equivalent multistage thermal RC ladder circuit used to a GaN HEMT large-signal model |
| Sub Title (in English) | |
| Keyword(1) | GaN HEMT |
| Keyword(2) | large signal model |
| Keyword(3) | power amplifier |
| Keyword(4) | RC ladder circuit |
| Keyword(5) | IMD3 |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Shingo Yoshida |
| 1st Author's Affiliation | The University of Electro-Communications (UEC) |
| 2nd Author's Name | Ryo Ishikawa |
| 2nd Author's Affiliation | The University of Electro-Communications (UEC) |
| 3rd Author's Name | Kazuhiko Honjo |
| 3rd Author's Affiliation | The University of Electro-Communications (UEC) |
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| Speaker | Author-1 |
| Date Time | 2013-12-19 11:50:00 |
| Presentation Time | 25 minutes |
| Registration for | MW |
| Paper # | MW2013-156 |
| Volume (vol) | vol.113 |
| Number (no) | no.365 |
| Page | pp.29-34 |
| #Pages | 6 |
| Date of Issue | 2013-12-12 (MW) |
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