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| Presentation | 2014-01-25 11:22 Evaluation of flexoelectric coefficients by using the SOITE method Taiki Watanabe (Nagaoka Univ. of Tech.), Taiju Takahashi (Kougakuin Univ.), Munehiro Kimura, Tadashi Akahane (Nagaoka Univ. of Tech.)  EID2013-31 Link to ES Tech. Rep. Archives: EID2013-31 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | It is well known that the electric polarization arises from the bend or spray distortion of the orientation. This phenomenon is called flexoelectric effect. Up to today, several kinds of measurement methods of the flexoelectric coefficient have been reported. However, the sign and/or the absolute value of the measured flexoelectric coefficient were different between the reports with regards to the common material. In this study, flexoelectric coefficient was investigated by the symmetric oblique incidence transmission Ellipsometry (SOITE). The state of polarization of the transmitted light through a hybrid aligned liquid crystal cell is changed by the applied DC electric field and the director reorientation. The outstanding feature of the SOITE is that the multiple reflection and multiple interference can be offset. We propose that the cell thickness and sum of the flexoelectric coefficients (e11+e33) can be obtained by experiment and numerical fitting procedure. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Liquid crystal / flexoelectric effect / ellipsometry / / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 113, no. 408, EID2013-31, pp. 125-128, Jan. 2014. | |
| Paper # | EID2013-31 | |
| Date of Issue | 2014-01-17 (EID) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | EID2013-31 Link to ES Tech. Rep. Archives: EID2013-31 |
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| Conference Information | |
| Committee | EID ITE-IDY IEIJ-SSL IEE-EDD SID-JC |
| Conference Date | 2014-01-24 - 2014-01-25 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Niigata University |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | EID |
| Conference Code | 2014-01-EID-IDY-SSL-EDD-JC |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Evaluation of flexoelectric coefficients by using the SOITE method |
| Sub Title (in English) | |
| Keyword(1) | Liquid crystal |
| Keyword(2) | flexoelectric effect |
| Keyword(3) | ellipsometry |
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| 1st Author's Name | Taiki Watanabe |
| 1st Author's Affiliation | Nagaoka University of Technology (Nagaoka Univ. of Tech.) |
| 2nd Author's Name | Taiju Takahashi |
| 2nd Author's Affiliation | Kogakuin University (Kougakuin Univ.) |
| 3rd Author's Name | Munehiro Kimura |
| 3rd Author's Affiliation | Nagaoka University of Technology (Nagaoka Univ. of Tech.) |
| 4th Author's Name | Tadashi Akahane |
| 4th Author's Affiliation | Nagaoka University of Technology (Nagaoka Univ. of Tech.) |
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| Speaker | Author-1 |
| Date Time | 2014-01-25 11:22:00 |
| Presentation Time | 8 minutes |
| Registration for | EID |
| Paper # | EID2013-31 |
| Volume (vol) | vol.113 |
| Number (no) | no.408 |
| Page | pp.125-128 |
| #Pages | 4 |
| Date of Issue | 2014-01-17 (EID) |
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