Paper Abstract and Keywords |
Presentation |
2014-01-28 15:00
[Poster Presentation]
Error-Prediction LDPC for NAND Flash Memory Tsukasa Tokutomi (Chuo Univ.), Shuhei Tanakamaru (Chuo Univ./Univ. of Tokyo.), Ken Takeuchi (Chuo Univ.) ICD2013-108 Link to ES Tech. Rep. Archives: ICD2013-108 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Error-Prediction LDPC (EP-LDPC) error correcting code (ECC) was proposed to improve the reliability of NAND flash memories. LDPC ECC is high reliability compared with the conventional BCH ECC. However the long read access time is the problem. EP-LDPC ECC can reduce the read access time by estimating errors from many factors (VTH, write/erase cycles, data-retention time, and inter-cell coupling information). This paper verifies the effectiveness of EP-LDPC ECC for the program-disturb and the data-retention error and compares with the BCH ECC. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
solid-state-drive / NAND flash memory / LDPC / reliability / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 113, no. 419, ICD2013-108, pp. 23-23, Jan. 2014. |
Paper # |
ICD2013-108 |
Date of Issue |
2014-01-21 (ICD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
ICD2013-108 Link to ES Tech. Rep. Archives: ICD2013-108 |
Conference Information |
Committee |
ICD |
Conference Date |
2014-01-28 - 2014-01-29 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kyoto Univ. Tokeidai Kinenkan |
Topics (in Japanese) |
(See Japanese page) |
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Paper Information |
Registration To |
ICD |
Conference Code |
2014-01-ICD |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Error-Prediction LDPC for NAND Flash Memory |
Sub Title (in English) |
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Keyword(1) |
solid-state-drive |
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NAND flash memory |
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LDPC |
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reliability |
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1st Author's Name |
Tsukasa Tokutomi |
1st Author's Affiliation |
Chuo University (Chuo Univ.) |
2nd Author's Name |
Shuhei Tanakamaru |
2nd Author's Affiliation |
Chuo University/University of Tokyo (Chuo Univ./Univ. of Tokyo.) |
3rd Author's Name |
Ken Takeuchi |
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Chuo University (Chuo Univ.) |
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Speaker |
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Date Time |
2014-01-28 15:00:00 |
Presentation Time |
120 minutes |
Registration for |
ICD |
Paper # |
ICD2013-108 |
Volume (vol) |
vol.113 |
Number (no) |
no.419 |
Page |
p.23 |
#Pages |
1 |
Date of Issue |
2014-01-21 (ICD) |